MIL-M-38510-60 Microcircuits, Digital, Ecl, Multiple Nor Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, ECL, logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/60B

TABLE I. Electrical performance characteristics - Continued.

Test

Symbol

Conditions

-55°C ≤ TC ≤ +125°C

Device

types

Limits

Unit

Min

Max

Transition time, low to high level

tTLH

VEEL = -3.2 V, VCC = +2.0 V,

= 50n, CL ≤ 5 pF (output under test)

Load = 100n to GND (outputs not under test)

Device type 05 only : VIH2 = +1.11 V VIL2 = +0.31 V

01, 02,

03, 04,

1.0

4.0

1.0

4.3

Transition time, high to low level

tTHL

01, 02,

03, 04,

1.0

4.0

1.0

4.3

Propagation delay time, low to high level

tPLH

01, 02,

03, 04,

1.0

3.7

1.0

4.5

Propagation delay time, high to low level

tPHL

01, 02,

03, 04,

1.0

3.7

1.0

4.5

Notes apply to device types 01-05 only.

1/ Not applicable to "B" inputs of device types 01 and 05.

2/ Applicable to "B" inputs only.

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