TA8LE III. Group A inspection for device type 04 - Continued.
Symbol |
MIL- STD- 883 method |
Cases A,C,D T,X,Y |
TERMINAL CONDITIONS 1/ |
Test limits |
Units |
|||||||||||||||||||
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Subgroup 9 TA = 25°C |
Subgroup 10 TA = 125°C |
Subgroup 11 TA = -55°C |
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Test No. |
1A |
18 |
2A |
28 |
2C |
2Y |
VSS |
1C |
1Y |
3Y |
3A |
38 |
3C |
VDD |
Min |
Max |
Min |
Max |
Min |
Max |
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tTHL " " " " " " " " |
3004 Fig. 3 " " " " " " " |
121 122 123 124 125 126 127 128 129 |
13/ GND " " " " " " " |
GND 13/ GND " " " " " " |
GND " " 13/ GND " " " " |
GND " " " 13/ GND " " " |
GND " " " " 13/ GND " " |
14/ 14/ 14/ |
GND " " " " " " " " |
GND GND 13/ GND " " " " " |
14/ 14/ 14/ |
14/ 14/ 14/ |
GND " " " " " 13/ GND " |
GND " " " " " " 13/ GND |
GND " " " " " " " 13/ |
5.0V " " " " " " " " |
1Y 1Y 1Y 2Y 2Y 2Y 3Y 3Y 3Y |
10 " " " " " " " " |
300 " " " " " " " " |
14 " " " " " " " " |
450 " " " " " " " " |
10 " " " " " " " " |
300 " " " " " " " " |
ns " " " " " " " " |
tTLH " " " " " " " " |
" " " " " " " " " |
130 131 132 133 134 135 136 137 138 |
13/ GND " " " " " " " |
" 13/ GND " " " " " " |
" " " 13/ GND " " " " |
" " " " 13/ GND " " " |
" " " " " 13/ GND GND GND |
14/ 14/ 14/ |
" " " " " " " " " |
GND GND 13/ GND " " " " " |
14/ 14/ 14/ |
14/ 14/ 14/ |
" " " " " " 13/ GND GND |
" " " " " " " 13/ GND |
GND " " " " " " " 13/ |
" " " " " " " " " |
1Y 1Y 1Y 2Y 2Y 2Y 3Y 3Y 3Y |
10 " " " " " " " " |
410 " " " " " " " " |
14 " " " " " " " " |
615 " " " " " " " " |
10 " " " " " " " " |
410 " " " " " " " " |
" " " " " " " " " |
1/ Input pins not designated may be tied to VCC or GND or may be left 7/ VIH = 3.80 V at 25°C, 3.65 V at 125°C, 3.95 V at -55°C. For
open provided they do not influence the outcome of the measurement. device type 01, VIH = 3.95 V at 25°C, 3.85 V at 125°C, and 4.05 V Output pins not designated may be tied to the loads or may be left open at -55°C.
provided they do not influence the outcome of the measurement, except 8/ IOL = .23 mA at 25°C, .23 mA at 125°C, .23 mA at -55°C.
as follows: VIC(pos) tests, the VSS terminals shall be open. VIC(neg) 9/ VIH = 9.50 V at 25°C, 9.25 V at 125°C, 9.75 V at -55°C. For tests, the VDD terminal shall be open. ISS tests, the output terminals device type 01, VIH = 10.25 V at 25°C, 10.00 V at 125°C and shall be open. 10.50 V at -55°C.
2/ When performing quiescent supply current measurements (ISS), the 10/ IOL = 0.8 mA at 25°C, 0.56 mA at 125°C, 1.0 mA at -55°C. meter shall be placed so that all currents flow thru the meter. 11/ The device manufacturer may, at his option, measure
3/ VIL = 1.0 V at 25°C, 0.85 V at 125°C, 1.35 V at -55°C. For device IIL and IIH at 25°C for each individual input or measure all inputs type 01, VIL = 0.9 V at 25°C, 0.65 V at 125°C, and 0.95 V at -55°C. together.
4/ IOH = -.10 mA at 25°C, -.10 mA at 125°C, -.10 mA at -55°C. 12/ Capacitance bridge between measured terminal and VSS:
5/ IOH = -.20 mA at 25°C, -.13 mA at 125°C, -.25 mA at -55°C. frequency = 1 MHz.
6/ VIL = 2.50 V at 25°C, 2.20 V at 125°C, 2.65 V at -55°C. For device 13/ Pulse conditions - See figure 3. type 01, VIL = 2.25 V at 25°C, 1.95 V at 125°C and 2.40 V at -55°C. 14/ Loading conditions - See figure 3.
15/ IOL = .40 mA at 25°C, .28 mA at 125°C, .50 mA at -55°C.
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