MIL-M-38510-505 Microcircuits, Digital, Bipolar Programmable Logic, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, bipolar, programmable logic microcircuits which employ titanium tungsten resistors as the fusible link or programming element. Two product assurance classes B and S and a choice of case outlines and lead finishes are provided and are reflected in the complete part or identifying number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/505C

NOTES:

1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting device.

2. CL = 45 pF minimum, including jig and probe capacitance; R1 = 390 0 ± 5%; R2 = 750 0 ±

5%.

3. Outputs may be under load simultaneously.

4. Requirements for tp (CL), tSU, and tH are established by setting parameters to the limits in table

I and observing proper output state changes.

5. VIH = 3.0 V; VIL = 0.0 V.

6. For circuit C, the diode / VBIAS = 2.5 V may be replaced with switch S1, and VBIAS of 5.0 V.

S1 is open for tPZH, tPHZ, and Fmax tests.

FIGURE 4. Switching time test circuit and waveforms - Continued.