MIL-M-38510/505C
TABLE I. Electrical performance characteristics - Continued.
Parameter |
Symbol |
Test condition 1/ -55° ≤ TC ≤ +125° 4.5 v ≤ vCC ≤ 5.5 v |
Device type |
Limits |
Unit |
|
Min |
Max |
|||||
Clock to output |
tPCH tPCL |
See figure 4 5/ CL = 45 pF minimum |
02,03 04 |
20 |
ns |
|
Minimum clock pulse width |
tP(CL) |
02,03 04 |
20 |
ns |
||
Minimum setup time |
tSU |
02,03 04 |
30 |
ns |
||
Minimum hold time |
tH |
All |
0 |
ns |
||
Maximum clock frequency |
fMAX |
02,03 04 |
20 |
MHz |
||
1/ All voltages referenced to ground.
2/ I/O terminal leakage is the worst case of IIX or IOZX.
3/ Only one output shorted at a time. Equivalent I0 test may be performed v0 = 2.25 v, -15 mA
minimum to -125 mA maximum.
4/ Applies to nonregistered outputs only, with internal output enables.
5/ Applies to registered outputs only, with external output enables (pin 13).
TABLE II. Electrical test requirements. 1/ 2/ 3/ 4/
MIL-PRF-38535 test requirements |
Subgroups (per table III) |
|
Class S devices |
Class B devices |
|
Interim electrical parameters (pre burn-in) |
1 |
1 |
Final electrical test parameters for unprogrammed devices |
1*, 2, 3, 7*, 8 |
1*, 2, 3, 7* |
Final electrical test parameters for programmed devices |
1*, 2, 3, 7*, 8, 9, 10, 11 |
1*, 2, 3, 7*, 8, 9 |
Group A test requirements |
1, 2, 3, 7, 8, 9, 10, 11 |
1, 2, 3, 7, 8, 9, 10, 11 |
Group B electrical test parameters when using the method 5005 QCI option. |
1, 2, 3, 7, 8, 9, 10, 11 |
N/A |
Group C end-point electrical parameters |
1, 2, 3, 7, 8, 9, 10, 11 |
1, 2, 3, 7, 8 |
Group D end-point electrical parameters |
1, 2, 3, 7, 8 |
1, 2, 3, 7, 8 |
1/ (*) indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ Subgroup 7 and 8 shall consist of verifying the pattern specified.
4/ Subgroup 8 requirements are for programmed devices only.
5
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