MIL-M-38510-505 Microcircuits, Digital, Bipolar Programmable Logic, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, bipolar, programmable logic microcircuits which employ titanium tungsten resistors as the fusible link or programming element. Two product assurance classes B and S and a choice of case outlines and lead finishes are provided and are reflected in the complete part or identifying number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/505C

4.4.3  Group C inspection.  Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:

a.  End-point electrical parameters shall be as specified in table II herein.

b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535.  The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.  The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.

c.  For qualification, at least 50 percent of the sample selected for life testing shall be programmed (see

3.3.2).  For quality conformance inspection, the programmability sample (see 4.4.1c) shall be included in the life test.

4.4.4  Group D inspection.  Group D inspection shall be in accordance with table V of MIL-PRF-38535  and as follows:

End-point electrical parameters shall be as specified in table II herein.

4.5  Methods of inspection.  Methods of inspection shall be as specified in the appropriate tables and as follows:

4.5.1        Voltage and current.  All voltages given are referenced to the microcircuit ground terminal.  Currents given are conventional current and positive when flowing into the referenced terminal.

4.6  Programming / verifying procedure for circuit A, B, and C.  Use the programming specifications on figure 5a, figure 6a,  and table III for circuit A; use figure 5b , figure 6a, and table VI for circuit B; use figure 5c, figure 6b, and table IX for circuit C; and the following procedures shall be used for programming the device.

4.6.1      Preverification.

4.6.1.1   Circuits A  and B.

a.    Raise VCC  to 5.0 volts.

b.    Raise output disable pin, OD, to VIHH.

c.        Select an input line by specifying inputs and L/R as shown in table IV for circuit A, and table VII for circuit B.

d.        Select a product line by specifying A0, A1, and A2 one of eight select as shown  in table V for circuit A, and table VIII for circuit B.

e.        Pulse the clock pin and verify (with clock at VIL) that the output pins, 00 through 03, are in the state corresponding to an unblown fuse.  Use the minimum timing conditions as specified on figure 5a for circuit A, and figure 5b for circuit B.

(1)    For verified unblown condition, continue procedure from 4.6.1.1c through 4.6.1.1e. (2)    For verified blown condition, stop procedure.

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