MIL-M-38510-343 Microcircuits, Digital, Bipolar, Advanced Schottky Ttl, Binary Counters, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced Schottky TTL, binary counter microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided or each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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TABLE III. Group A inspection for device type 04 - Continued.

Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).

1/ For cases X and 2, pins not referenced are NC.

2/ Apply one pulse prior to measurement.

3.0 V min/5.5 V max 3.0 V min/5.5 V max

0 V 0 V

3/ For device type 02, Circuit A, the IIL1 minimum and maximum test limits of measured terminal SR , shall be the same as those listed for the IIL2 test, Circuit A, herein.

Parameter	Device	Circuit	Circuit	Circuit	Circuit
Parameter	Device	A	B	C	D
IIL1	All	-.25/-0.6	-.03/-0.6	-.25/-0.6	0/-0.6
IIL2	01, 02	-.50/-1.2	-.06/-1.2	-.50/-1.2	0/-0.6
IIL2	03, 04	-.75/-1.8	-.09/-1.8	-.50/-1.8

4/ For types 01 and 02, set outputs to 15th count (P0, P1, P2, P3 = 1), prior to measurement.

5/ H � 1.5 V, L s 1.5 V, A = 3.0 V minimum; B = 0.0 V or GND.

6/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.

7/ The fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.

8/ For types 01 and 02, increment such that measurement of the specified output can occur on the next applied CP.

9/ fMAX shall be measured only under the conditions of initial qualification and after process or design changes which may affect this parameter. For all other conditions, fMAX shall be guaranteed, if not tested, to the limits specified in table III, herein.