MIL-M-38510-327 Microcircuits, Digital, Bipolar, Low-Power Schottky Ttl, Counters, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, binary and decade counters microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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TABLE lll.  Group A inspection for device type 01 - Continued.

Terminal conditions (pins not designated may be high � 2.0 V; low s 0.7 V; or open).

1/      Apply

2/      Apply

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- - 2.0 V min./5.5 V max.  prior to test after clear pulse.

0.0 ±0.2 V

- - 2.0 V min./5.5 V max.  pulse prior to test.

0.0 ±0.2 V

3/      Apply 2 pulses prior to test after clear pulse (see 1/).

4/      Apply 4 pulses prior to test after clear pulse (see 1/).

5/      For tests 9 and 13, llL3 maximum value pulse 4 mA shall be applied to output QA.

6/      llL  limits shall be as follows:

7/      Only a summary of attributes data is required.

8/      A = 2.4 V min. and B = 0.4 V max.

9/      Output voltages shall be either:

a.  H � 2.5 V and L s 0.4 V when using a high speed double comparator, or b.  H � 1.5 V and L s 1.5 V when using a high speed single comparator.

10/    FMAX1  and FMAX2  minimum limits specified are the frequency of the input pulse.

The output pulse shall be one half the input frequency when measuring QA.

The output shall be one fifth of the input frequency when measuring QD.

11/    Apply sufficient

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- - 2.0 V min./5.5 V max.  pulses to set output high prior to test.

0.0 ±0.2 V

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