MIL-M-38510-327 Microcircuits, Digital, Bipolar, Low-Power Schottky Ttl, Counters, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, binary and decade counters microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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Test

Symbol

Conditions

-55°C ≤ TC  ≤ +125°C

Device type

Limits

Unit

Min

Max

Propagation delay time, low-to-high

tPLH2

VCC  = 5.0 V, CL  = 50 pF,

RL  = 2 kn

B to QD

01

2

34

ns

A to QD

02

2

93

CLK to QA

03

2

77

Propagation delay time, high to low

tPHL2

VCC  = 5.0 V, CL  = 50 pF,

RL  = 2 kn

B to QD

01

2

34

ns

A to QD

02

2

93

CLK to QC

03

2

77

Propagation delay time, high-to-low level,

CLR to Q

tPHL3

VCC  = 5.0 V

CL  = 50 pF, RL  = 2 kn

All

2

56

ns

Propagation delay time, low to high level, set to 9 to QA

tPLH4

VCC  = 5.0 V

CL  = 50 pF, RL  = 2 kn

03

2

57

ns

Propagation delay time, high to low level, set to 9 to QB

tPHL4

VCC  = 5.0 V

CL  = 50 pF, RL  = 2 kn

03

2

53

ns

MIL-PRF-38535 test requirements

Subgroups (see table III)

Class S

devices

Class B

devices

Interim electrical parameters

1

1

Final electrical test parameters

1*, 2, 3, 7, 9,

10, 11

1*, 2, 3, 7, 9

Group A test requirements

1, 2, 3, 7, 8,

9, 10, 11

1, 2, 3, 7,

9, 10, 11

Group B electrical test parameters

when using the method 5005 QCI option

1, 2, 3, 7, 8

9, 10, 11

N/A

Group C end-point electrical parameters

1, 2, 3, 7, 8

9, 10, 11

1, 2, 3

Group D end-point electrical parameters

1, 2, 3

1, 2, 3