TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high � 2.0 V, or low s 0.7 V, or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases A, C, D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Cases 2 1/ |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
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Test no. |
1C |
1A |
1Y |
2C |
2A |
2Y |
GND |
3Y |
3A |
3C |
4Y |
4A |
4C |
VCC |
Min |
Max |
|||||
10 Tc = 125°C |
tPHL |
3003 Fig 3 " " |
82 |
GND |
IN |
OUT |
GND |
5.0 V |
1A to 1Y |
2 |
24 |
ns |
|||||||||
83 |
GND |
IN |
OUT |
" |
" |
2A to 2Y |
" |
" |
" |
||||||||||||
84 |
" |
OUT |
IN |
GND |
" |
3A to 3Y |
" |
" |
" |
||||||||||||
85 |
" |
OUT |
IN |
GND |
" |
4A to 4Y |
" |
" |
" |
||||||||||||
tPLH |
" " " " |
86 |
GND |
IN |
OUT |
" |
" |
1A to 1Y |
" |
20 |
" |
||||||||||
87 |
GND |
IN |
OUT |
" |
" |
2A to 2Y |
" |
" |
" |
||||||||||||
88 |
" |
OUT |
IN |
GND |
" |
3A to 3Y |
" |
" |
" |
||||||||||||
89 |
" |
OUT |
IN |
GND |
" |
4A to 4Y |
" |
" |
" |
||||||||||||
tPZH |
" " " " |
90 |
IN |
5.0 V |
OUT |
" |
" |
1C to 1Y |
" |
28 |
" |
||||||||||
91 |
IN |
5.0 V |
OUT |
" |
" |
2C to 2Y |
" |
" |
" |
||||||||||||
92 |
" |
OUT |
5.0 V |
IN |
" |
3C to 3Y |
" |
" |
" |
||||||||||||
93 |
" |
OUT |
5.0 V |
IN |
" |
4C to 4Y |
" |
" |
" |
||||||||||||
tPZL |
" " " " |
94 |
IN |
GND |
OUT |
" |
" |
1C to 1Y |
" |
33 |
" |
||||||||||
95 |
IN |
GND |
OUT |
" |
" |
2C to 2Y |
" |
" |
" |
||||||||||||
96 |
" |
OUT |
GND |
IN |
" |
3C to 3Y |
" |
" |
" |
||||||||||||
97 |
" |
OUT |
GND |
IN |
" |
4C to 4Y |
" |
" |
" |
||||||||||||
tPHZ |
" " " " |
98 |
IN |
5.0 V |
OUT |
" |
" |
1C to 1Y |
" |
41 |
" |
||||||||||
99 |
IN |
5.0 V |
OUT |
" |
" |
2C to 2Y |
" |
" |
" |
||||||||||||
100 |
" |
OUT |
5.0 V |
IN |
" |
3C to 3Y |
" |
" |
" |
||||||||||||
101 |
" |
OUT |
5.0 V |
IN |
" |
4C to 4Y |
" |
" |
" |
||||||||||||
tPLZ |
" " " " |
102 |
IN |
GND |
OUT |
" |
" |
1C to 1Y |
" |
33 |
" |
||||||||||
103 |
IN |
GND |
OUT |
" |
" |
2C to 2Y |
" |
" |
" |
||||||||||||
104 |
" |
OUT |
GND |
IN |
" |
3C to 3Y |
" |
" |
" |
||||||||||||
105 |
" |
OUT |
GND |
IN |
" |
4C to 4Y |
" |
" |
" |
||||||||||||
11 |
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C. |
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1/ Pins not referenced are NC.
2/ For circuits A and B, pin conditions shall be low s 0.7 V; for circuits C, D, and E pin conditions shall be low s 0.7 V, high � 2.0 V, or open.
3/ Minimum and maximum test limits for IIL1 and IIL3 shall be as follows:
Tests |
Circuits |
||||
A |
B |
C |
D |
E |
|
IIL1 |
-1.0/-150 |
-120/-360 |
0/-200 |
-160/-400 |
-140/-370 |
IIL3 |
-150/-380 |
-160/-400 |
0/-200 |
0/-100 |
-140/-370 |
4/ Circuit E tests 54 through 57, IOS, min -30/max -130 mA.
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