TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high � 2.0 V; low s 0.7 V; or open).
1/ Min/max limits (µA) for circuits, unless otherwise specified.
Test |
Min/max limits (mA) |
||||
A |
B |
C |
E |
F |
|
IIL1 |
-120/-360 |
-30/-300 |
-160/-400 except -120/-360 for test 24 |
-120/-360 except -0.5/-360 for test 22 |
-135/-370 except -150/-380 for test 23; -135/-380 for tests 24, 25, 26 |
IIL2 |
-36 mA/-1.08 mA |
-90/-900 |
-305/-760 |
-.36 mA/-1.08 mA |
-.48 mA/-1.20 mA |
IIL3 |
-240/-720 |
-60/-600 |
-305/-760 |
-240/-720 |
-320/-800 |
2/ IOS limits for circuits B, C, and E are -15/-100 mA.
3/ Connect a 0.5 kn to 2 kn resistor from terminals, 6, 7, 9, and 10 to VCC for subgroup 7 tests.
4/ A = 3.0 V min., B = 0.0 V or GND, C = pulse 3.0 V ─┐ ┌─ 3.0 V
0.0 V └──┘
5/ Output voltages shall be: H > 1.5 V, L < 1.5 V
6/ Load ground into register under test prior to test.
7/ Load one state into register under test prior to test.
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