TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high 2.0 V, low σ 0.7 V, or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases A,B,C,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Case 1/ 2 |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
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Test no. |
1A |
1B |
NC |
1C |
1D |
1Y |
GND |
2Y |
2A |
2B |
NC |
2C |
2D |
VCC |
Min |
Max |
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9 Tc = 25°C |
tPHL |
3003 Fig. 3 |
47 |
IN |
2.7 V |
2.7 V |
2.7 V |
OUT |
GND |
5.0 V |
1A to 1Y |
2 |
25 |
ns |
|||||||
48 |
" |
OUT |
IN |
2.7 V |
2.7 V |
2.7 V |
" |
2A to 2Y |
" |
" |
" |
||||||||||
tPLH |
" " |
49 |
IN |
2.7 V |
2.7 V |
2.7 V |
OUT |
" |
" |
1A to 1Y |
" |
" |
" |
||||||||
50 |
" |
OUT |
IN |
2.7 V |
2.7 V |
2.7 V |
" |
2A to 2Y |
" |
" |
" |
||||||||||
10 Tc = 125°C |
tPHL |
" " |
51 |
IN |
2.7 V |
2.7 V |
2.7 V |
OUT |
" |
" |
1A to 1Y |
" |
30 |
" |
|||||||
52 |
" |
OUT |
IN |
2.7 V |
2.7 V |
2.7 V |
" |
2A to 2Y |
" |
" |
" |
||||||||||
tPLH |
" " |
53 |
IN |
2.7 V |
2.7 V |
2.7 V |
OUT |
" |
" |
1A to 1Y |
" |
" |
" |
||||||||
54 |
" |
OUT |
IN |
2.7 V |
2.7 V |
2.7 V |
" |
2A to 2Y |
" |
" |
" |
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11 |
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C. |
1/ For case 2, pins not referenced are NC.
2/ IOS limits for CKTS B, C, and D are -15/-100 mA.
3/ IIL limits for CKT B are -30 to -300 μA; CKT C, -150 to -380 μA; CKT D, -120 to -360 μA; CKT F, -5 to -400 μA.
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