TA8LE III. Group A inspection for device type 03 - Continued.
Symbol |
MIL- STD-833 method |
Cases A, C, D, T, X, and Y |
Terminal conditions 11 |
Measured terminal |
Test limits |
Units |
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Subgroup 12 TA = 25°C |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
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Test No. |
2A |
28 |
1A |
18 |
1C |
1Y |
VSS |
2C |
2Y |
3Y |
3A |
38 |
3C |
VDD |
Min |
Max |
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tPHL " " " " " " " " |
3003 Fig. 3 " " " " " " " |
160 161 162 163 164 165 166 167 168 |
GND GND GND IN GND " " " " |
GND " " " IN GND " " " |
IN GND GND " " " " " " |
GND IN GND " " " " " " |
GND GND IN GND " " " " " |
OUT OUT OUT |
GND " " " " " " " " |
GND " " " " IN GND " " |
OUT OUT OUT |
OUT OUT OUT |
GND " " " " " IN GND GND |
GND " " " " " " IN GND |
GND " " " " " " " IN |
10.0V " " " " " " " " |
1A to 1Y 18 to 1Y 1C to 1Y 2A to 2Y 28 to 2Y 2C to 2Y 3A to 3Y 38 to 3Y 3C to 3Y |
6 " " " " " " " " |
120 " " " " " " " " |
ns " " " " " " " " |
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tPLH " " " " " " " " |
" " " " " " " " " |
169 170 171 172 173 174 175 176 177 |
" " " IN GND " " " " |
" " " " IN GND " " " |
IN GND " " " " " " " |
" IN GND " " " " " " |
" " IN GND " " " " " |
OUT OUT OUT |
" " " " " " " " " |
" " " " " IN GND " " |
OUT OUT OUT |
OUT OUT OUT |
" " " " " " IN GND GND |
" " " " " " " IN GND |
GND " " " " " " " IN |
" " " " " " " " " |
1A to 1Y 18 to 1Y 1C to 1Y 2A to 2Y 28 to 2Y 2C to 2Y 3A to 3Y 38 to 3Y 3C to 3Y |
6 " " " " " " " " |
120 " " " " " " " " |
ns " " " " " " " " |
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tTHL " " " " |
3004 Fig. 3 " " " |
178 179 180 181 182 |
" " " IN GND |
" " " " IN |
IN GND " " " |
" IN GND GND GND |
" " IN GND GND |
OUT OUT OUT |
" " " " " |
" " " " " |
OUT OUT |
" " " " " |
" " " " " |
GND " " " " |
" " " " " |
1Y 1Y 1Y 2Y 2Y |
5 " " " " |
100 " " " " |
ns " " " " |
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tTHL " " " |
3004 Fig. 3 " " |
183 184 185 186 |
GND " " " |
GND " " " |
GND " " " |
GND " " " |
GND " " " |
GND " " " |
IN GND " " |
OUT |
OUT OUT OUT |
GND IN GND GND |
GND GND IN GND |
GND GND GND IN |
10.0V " " " |
2Y 3Y 3Y 3Y |
5 " " " |
100 " " " |
ns " " " |
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tTLH " " " " " " " " |
3004 Fig. 3 " " " " " " " |
187 188 189 190 191 192 193 194 195 |
" " " IN GND " " " " |
" " " " IN GND " " " |
IN GND " " " " " " " |
" IN GND " " " " " " |
" " IN GND " " " " " |
OUT OUT OUT |
" " " " " " " " " |
" " " " " IN GND GND GND |
OUT OUT OUT |
OUT OUT OUT |
" " " " " " IN GND GND |
" " " " " " " IN GND |
GND " " " " " " " IN |
" " " " " " " " " |
1Y 1Y 1Y 2Y 2Y 2Y 3Y 3Y 3Y |
5 " " " " " " " " |
100 " " " " " " " " |
ns " " " " " " " " |
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11 Pins not designated may be "HIGH" level logic, "LOW" level logic or open. Exceptions are as follows: VIC(pos) tests, the VSS terminals shall be open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output terminals shall be open.
21 The ISS measurements shall be performed in sequence.
31 The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
41 See 4.4.1c
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