TA8LE III. Group A inspection for device type 01 - Continued.
Symbol |
MIL- STD-833 method |
Cases A, C, D, T, X, and Y |
Terminal conditions 11 |
Measured terminal |
Test limits |
Units |
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Subgroup 12 TA = 25°C |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
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Test No. |
1A |
18 |
1Y |
2Y |
2A |
28 |
VSS |
3A |
38 |
3Y |
4Y |
4A |
48 |
VDD |
Min |
Max |
Min |
Min |
Max |
Min |
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tPHL " " " " " " " |
3003 Fig. 3 " " " " " " |
150 151 152 153 154 155 156 157 |
IN GND " " " " " " |
GND IN GND " " " " " |
OUT OUT |
OUT OUT |
GND GND IN GND " " " " |
GND GND GND IN GND " " " |
GND " " " " " " " |
GND " " " IN GND " " |
GND " " " " IN GND " |
OUT OUT |
OUT OUT |
GND " " " " " IN GND |
GND " " " " " " IN |
10.0 V " " " " " " " |
1A to 1Y 18 to 1Y 2A to 2Y 28 to 2Y 3A to 3Y 38 to 3Y 4A to 4Y 48 to 4Y |
6 " " " " " " " |
120 " " " " " " " |
ns " " " " " " " |
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tPLH " " " " " " " |
" " " " " " " " |
158 159 160 161 162 163 164 165 |
IN GND " " " " " " |
" IN GND " " " " " |
OUT OUT |
OUT OUT |
" " IN GND " " " " |
" " " IN GND " " " |
" " " " " " " " |
" " " " IN GND " " |
" " " " " IN GND " |
OUT OUT |
OUT OUT |
" " " " " " IN GND |
GND " " " " " " IN |
" " " " " " " " |
1A to 1Y 18 to 1Y 2A to 2Y 28 to 2Y 3A to 3Y 38 to 3Y 4A to 4Y 48 to 4Y |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
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tTHL " " " " " " " |
3004 Fig. 3 " " " " " " |
166 167 168 169 170 171 172 173 |
IN GND " " " " " " |
" IN GND " " " " " |
OUT OUT |
OUT OUT |
" " IN GND " " " " |
" " " IN GND " " " |
" " " " " " " " |
" " " " IN GND " " |
" " " " " IN GND " |
OUT OUT |
OUT OUT |
" " " " " " IN GND |
GND " " " " " " IN |
" " " " " " " " |
1Y 1Y 2Y 2Y 3Y 3Y 4Y 4Y |
5 " " " " " " " |
100 " " " " " " " |
" " " " " " " " |
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tTLH " " " " " " " |
" " " " " " " " |
174 175 176 177 178 179 180 181 |
IN GND " " " " " " |
GND IN GND " " " " " |
OUT OUT |
OUT OUT |
GND GND IN GND " " " " |
GND GND GND IN GND GND GND GND |
GND " " " " " " " |
GND " " " IN GND GND GND |
GND " " " " IN GND GND |
OUT OUT |
OUT OUT |
GND " " " " " IN GND |
GND " " " " " " IN |
10.0V " " " " " " " |
1Y 1Y 2Y 2Y 3Y 3Y 4Y 4Y |
5 " " " " " " " |
100 " " " " " " " |
ns " " " " " " " |
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11 Pins not designated may be "HIGH" level logic, "LOW" level logic or open. Exceptions are as follows: VIC(pos) tests, the VSS terminals shall be open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output terminals shall be open.
21 The ISS measurements shall be performed in sequence.
31 The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
41 See 4.4.1c.
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