TABLE III. Group A inspection for device type 02 - Continued. 1/
Subgroup |
Symbol |
MIL- STO-883 method |
Cases E,F |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Measured terminal |
Test limits |
Unit |
|
Test no. |
E |
A<B |
B0 |
B1 |
B2 |
B3 |
B4 |
GNO |
A4 |
A3 |
A2 |
A1 |
A0 |
A = B |
A > B |
VCC |
Min |
Max |
|||||
10 TC= +125°C |
tPLH8 |
3003 (Fig.5) " " " |
162 |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
IN |
OUT |
5.0V |
A0 to A>B |
3 |
30 |
ns |
||
tPHL8 |
163 |
" |
GNO |
GNO |
GNO |
GNO |
GON |
" |
GNO |
GNO |
GNO |
GNO |
IN |
" |
" |
A0 to A>B |
3 |
25 |
" |
||||
tPLH9 |
164 |
" |
IN |
2.4V |
2.4V |
2.4V |
2.4V |
" |
2.4V |
2.4V |
2.4V |
2.4V |
2.4V |
" |
" |
B0 to A>B |
6 |
39 |
" |
||||
tPHL9 |
165 |
" |
IN |
2.4V |
2.4V |
2.4V |
2.4V |
" |
2.4V |
2.4V |
2.4V |
2.4V |
2.4V |
" |
" |
B0 to A>B |
6 |
35 |
" |
||||
11 |
Same conditions and limits as subgroup 10, except TC = -55°C. |
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NOTES:
1/ Pins not designated may be "high" level logic, "low" level logic or open.
2/ Tests shall be performed in sequence.
3/ Output voltages shall be either: (a) H = 2.4 V minimum and L = 0.4 V maximum, when using a high speed checker double comparator;
or (b) H � 1.5 V when using a high speed checker single comparator.
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