TABLE III. Group A inspection for device type 01 - Continued. 1/
Subgroup |
Symbol |
MIL-STO- 883 method |
Cases E, F |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Measured terminal |
Limits |
Unit |
|
Test no. |
B3 |
A < B IN |
A = B IN |
A > B IN |
A > B OUT |
A = B OUT |
A < B OUT |
GNO |
B0 |
A0 |
B1 |
A1 |
A2 |
B2 |
A3 |
VCC |
Min |
Max |
|||||
10 Tc = 125°C |
tPHL2 |
3003 Fig. 4 " " " " " " " |
130 |
IN |
2.4 V |
OUT |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
GNO |
5.0 V |
B3 to A = B |
2 |
43 |
ns |
||||
131 |
GNO |
" |
" |
" |
IN |
" |
" |
" |
" |
" |
" |
" |
B0 to A = B |
" |
" |
" |
|||||||
132 |
" |
" |
" |
" |
GNO |
" |
IN |
" |
" |
" |
" |
" |
B1 to A = B |
" |
" |
" |
|||||||
133 |
" |
" |
" |
" |
" |
" |
GNO |
" |
IN |
" |
" |
" |
A2 to A = B |
" |
" |
" |
|||||||
tPHL3 |
134 |
" |
IN |
GNO |
OUT |
" |
" |
" |
" |
" |
GNO |
" |
GNO |
" |
A<B to A>B |
" |
26 |
" |
|||||
135 |
" |
GNO |
IN |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A=B to A>B |
" |
" |
" |
||||||
tPHL5 |
136 |
" |
IN |
GNO |
OUT |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A=B to A<B |
" |
" |
" |
|||||
137 |
" |
GNO |
IN |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A>B to A<B |
" |
" |
" |
||||||
tPHL4 |
138 |
" |
IN |
OUT |
" |
" |
" |
" |
" |
" |
" |
" |
A=B to A=B |
" |
" |
" |
|||||||
11 |
Same tests, terminal conditions and limits as subgroup 10, except TC = -55°C. |
NOTES:
1/ Pins not designated may be "high" level logic, "low" level logic or open.
2/ Tests shall be performed in sequence.
3/ Output voltages shall be either; (a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator; or
(b) H � 1.5 V when using a high speed checker single comparator.
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