MIL-M-38510-15 Microcircuits, Digital, Ttl, Bistable Latches, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, TTL, 4-bit bistable latch microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/158

1.3  Absolute maximum ratings.

Supply voltage range ......................................................  -0.5 V dc to +7.0 V dc

Input voltage range .........................................................  -1.5 V dc at -12 mA to +5.5 V dc

Storage temperature range  ............................................  -65°C to +150°C Maximum power dissipation per gate,  (PD)   1/

Device types 01 and 02 ...........................................  280 mW dc

Device type 03  ........................................................  630 mW dc

Device type 04  ........................................................  325 mW dc

Lead temperature (soldering 10 seconds) ......................  300°C

Thermal resistance, junction-to-case  (eJC)......................  (See MIL-STD-1835) Junction temperature  (TJ ) 2/..........................................  175°C

1.4  Recommended operating conditions.

Supply voltage ................................................................  4.5 V dc minimum to 5.5 V dc maximum

Minimum high level input voltage  ...................................  2.0 V dc Maximum low level input voltage ....................................  0.8 V dc Normalized fanout (each output) 3/  ................................  5 maximum Case operating temperature range (TC  ) .........................  -55°C to 125°C Setup time, t(SETUP) data to output

Types 01 and 02  .....................................................  25 ns minimum

Setup time t(SETUP), type 03

Data to enable (high) ...............................................  10 ns minimum

Data to enable (low)  ................................................  16 ns minimum

Setup time t(SETUP), type 04

Data to enable (high) ...............................................  5 ns minimum

Data to enable (low)  ................................................  25 ns minimum

Setup time, t(SETUP) data to set (high)

Type 04  ...................................................................  8 ns minimum

Input hold time t(HOLD), types 01 and 02

Clock to data  ...........................................................  5 ns minimum

Data to clock  ...........................................................  30 ns minimum

Input hold time t(HOLD), type 03

Data to enable (high)................................................  0 ns maximum

Data to enable (low)  ................................................  4 ns maximum

Input hold time t(HOLD), type 04

Data to enable (high)................................................  0 ns maximum

Data to enable (low)  ................................................  7 ns maximum

Input hold time t(HOLD), type 04

Data to set (low)  ......................................................  8 ns maximum

2.0  APPLICA8LE DOCUMENT

2.1  General.  The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples.  While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed.

1/  Must withstand the added PD due to short circuit condition (e.g. IOS) at one output for 5 seconds duration.

2/  Maximum junction temperature should not be exceeded except in accordance with allowable short

duration burn-in screening condition in accordance with MIL-PRF-38535.

3/  Device will fanout in both high and low levels to the specified number of inputs of the same device type as that being tested.

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