MIL-M-38510/148B
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 7, 8, 9, 10, and 11 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.
4.5.1 Voltage and current. All voltage values are referenced to the external zero reference level of the supply voltage. Currents given are conventional and positive when flowing into the referenced terminal.
4.5.2 Life test and burn-in cooldown procedure. When devices are measured at +25°C following application of the steady state life or burn-in test condition, they shall be cooled within 10°C of their power stable condition prior to removal of the bias.
4.6 Data reporting. When specified in the acquisition document, a copy of the following data, as applicable, shall be applied:
a. Attributes data for all screening tests (see 4.2) and variables data for all static burn-in, dynamic burn-in, and operating life tests.
b. A copy of each radiograph.
c. The quality conformance inspection data (see 4.4).
d. Parameter distribution data on parameters evaluated during burn-in (see 3.5). e. Final electrical parameter data (see 4.2).
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