TABLE III. Group A inspection for device type 08 - Continued.
Terminal conditions (pins not designated may be H > 2.0 V, or L < 0.8 V, or open)
Subgroup |
Symbol |
MIL- STD-883 method |
Cases E,F |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Measured terminal |
Test limits |
Unit |
|
X, 2 5/ |
2 |
3 |
4 |
5 |
7 |
8 |
9 |
10 |
12 |
13 |
14 |
15 |
17 |
18 |
19 |
20 |
Min |
Max |
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Test no. |
1G |
B |
1C3 |
1C2 |
1C1 |
1C0 |
1Y |
GND |
2Y |
2C0 |
2C1 |
2C2 |
2C3 |
A |
2G |
VCC |
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9 TC = +25°C |
tPLH2 |
3003 Fig. 10 " " |
91 92 93 94 |
GND GND |
GND IN GND IN |
GND |
GND |
2.7 V 2.7 V |
OUT OUT |
GND " " " |
OUT OUT |
2.7 V 2.7 V |
GND |
GND |
IN GND IN GND |
GND GND |
5.0 V " " " |
1Y 1Y 2Y 2Y |
2.0 " " " |
20 " " " |
ns " " " |
||
tZH |
" " |
95 96 |
IN " |
GND " |
2.7 V |
OUT |
" " |
OUT |
2.7 V |
" " |
IN |
" " |
1Y 2Y |
" " |
23 23 |
" " |
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tZL |
" " |
97 98 |
" " |
" " |
GND |
OUT |
" " |
OUT |
GND |
" " |
IN |
" " |
1Y 2Y |
" " |
24 24 |
" " |
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tHZ |
" " |
99 100 |
" " |
" " |
2.7 V |
OUT |
" " |
OUT |
2.7 V |
" " |
IN |
" " |
1Y 2Y |
" " |
13.5 13.5 |
" " |
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tLZ |
" " |
101 102 |
" " |
" " |
GND |
OUT |
" " |
OUT |
GND |
" " |
IN |
" " |
1Y 2Y |
" " |
15.5 15.5 |
" " |
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10 TC = +125°C |
Same tests and terminal conditions as subgroup 9, with limits as follows: tPHL1 = 14.5 ns, tPLH1 = 14.5 ns, tPHL2 = 26 ns, tPLH2 = 26 ns, tZH = 30 ns, tZL = 31 ns, tHZ = 18 ns, tLZ = 20 ns. |
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11 |
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C. |
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1/ A = 2.4 V; B = 0.4 V.
2/ H > 1.5 V; L < 1.5 V.
3/ Only a summary of attributes is required.
4/ For circuit B, IOS(max) = -110 mA.
5/ Case 2 pins not designated are NC.
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