MIL-M-38510-762 Microcircuits, Digital, Advanced Cmos, Multiplexers, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/7628

NOTES:

1.    PREFERRED METHOD:

When measuring tPHZ  or tPZH: VTEST  = GND. When measuring tPLZ  or tPZL: VTEST  = 2(VCC).

2.    ALTERNATE METHOD:

When measuring tPHZ  or tPZH: VTEST  = OPEN. When measuring tPLZ  or tPZL: VTEST  = 2(VCC).

3.    CL = 50pF or equivalent (includes test jig and probe capacitance).

4.    RL  = 500n or equivalent.

5.    RT  = 50n or equivalent.

6.        Input signal from pulse generator:  VIN  = 0.0 V to VCC;  PRR ≤ 10 MHz;  duty cycle = 50 percent, tr  ≤ 3.0 ns; tf  ≤ 3.0 ns; tr  and tf  shall be measured from 10% of VCC  to 90% of VCC and from 90% of VCC  to 10% of VCC, respectively.

7.    Timing parameters shall be tested at a minimum input frequency of 1 MHz.

FIGURE 4.  Switching waveforms and test circuits - Continued.

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