MIL-M-38510/755B
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein.
4.1.1 Burn-in and life test circuits. Burn-in and life test circuits shall be constructed so that the devices are stressed at the maximum operating conditions stated in 4.2c or 4.2d, as applicable, or equivalent as approved by the qualifying activity.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
b. Delete the sequence specified as initial (pre-burn-in) electrical parameters through interim (post-burn-in) electrical parameters of method 5004 and substitute lines 1 through 7 of table II herein.
c. Static burn-in, test condition A, method 1015 of MIL-STD-883. Test duration for each static test shall be 24 hours minimum for class S devices and in accordance with table I of method 1015 for class B devices.
(1) For static burn-in I, the output enable control pin(s) shall be connected to the resistors in parallel to VCC or GND, as applicable, to enable the outputs. The directional control pin(s) shall be connected to either VCC or GND. All other inputs shall be connected to GND. Outputs may be open or connected to VCC/2. Resistors R1 are optional on both inputs and open outputs, and required on outputs connected to
VCC/2 ±0.5 V. R1 = 220ν to 47 kν.
(2) For static burn-in II, the output enable control pin(s) shall be connected to the resistors in parallel to VCC or GND, as applicable, to enable the outputs. The directional control pin(s) shall be connected to either VCC or GND. All other inputs shall be connected through the R1 resistors to VCC. Outputs may be open or connected to VCC/2 ±0.5 V. Resistors R1 are optional to open outputs, and required on outputs connected to VCC/2 ±0.5 V. R1 = 220ν to 47 kν.
(3) VCC = 5.5 V +0.5 V, -0.00 V.
d. Dynamic burn-in, test condition D, method 1015 of MIL-STD-883. (1) Input resistors = 220ν to 2 kν ±20 percent.
(2) Output resistors = 220ν ±20 percent.
(3) VCC = 5.5 V +0.5 V, -0.00 V.
(4) The output enable control pin(s) shall be connected through the resistors in parallel to VCC or GND, as applicable, to enable the outputs. The directional control pin(s) shall be connected to either VCC or GND. All other inputs shall be connected through the resistors in parallel to a clock pulse (CP). Outputs shall be connected to VCC/2 through the resistors.
(5) CP = 25 kHz to 1 MHz square wave; duty cycle = 50 percent ±15 percent; VIH = 4.5 V to VCC, VIL = 0 V ±0.5 V; tr, tf ≤ 100 ns.
e. Interim and final electrical test parameters shall be as specified in table II.
f. For class S devices, post dynamic burn-in, or class B devices, post static burn-in, electrical parameter measurements may, at the manufacturer's option, be performed separately or included in the final electrical parameter requirements.
20
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business