TA8LE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open)
Subgroup |
Symbol |
MIL- STD-883 method |
Cases X,2 1/ |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
Measured terminal |
Test limits |
Unit |
|
Cases A, 8, C, D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
|||||||
Test no. |
1A |
18 |
1Y |
2A |
28 |
2Y |
GND |
3Y |
3A |
38 |
4Y |
4A |
48 |
VCC |
Min |
Max |
|||||
9 TC = 25°C |
tPLH |
3003 Fig. 3 " " " " " " |
63 64 65 66 67 68 69 70 |
IN 2.7 V " " " " " " |
2.7 V IN 2.7 V " " " " " |
OUT OUT |
2.7 V 2.7 V IN 2.7 V " " " " |
2.7 V " " IN 2.7 V " " " |
OUT OUT |
GND " " " " " " " |
OUT OUT |
2.7 V " " " IN 2.7 V " " |
2.7 V " " " " IN 2.7 V " |
OUT OUT |
2.7 V " " " " " IN 2.7 V |
2.7 V " " " " " " IN |
5.0 V " " " " " " " |
1A to 1Y 18 to 1Y 2A to 2Y 28 to 2Y 3A to 3Y 38 to 3Y 4A to 4Y 48 to 4Y |
2.0 " " " " " " " |
7.0 " " " " " " " |
ns " " " " " " " |
10 TC = 125°C |
tPHL |
" " " " " " " " |
71 72 73 74 75 76 77 78 |
IN 2.7 V " " " " " " |
" IN 2.7 V " " " " " |
OUT OUT |
" " IN 2.7 V " " " " |
" " " IN 2.7 V " " " |
OUT OUT |
" " " " " " " " |
OUT OUT |
" " " " IN 2.7 V " " |
" " " " " IN 2.7 V " |
OUT OUT |
" " " " " " IN 2.7 V |
2.7 V " " " " " " IN |
" " " " " " " " |
1A to 1Y 18 to 1Y 2A to 2Y 28 to 2Y 3A to 3Y 38 to 3Y 4A to 4Y 48 to 4Y |
" " " " " " " " |
9.0 " " " " " " " |
" " " " " " " " |
tPLH |
" " " " " " " " |
79 80 81 82 83 84 85 86 |
IN 2.7 V " " " " " " |
" IN 2.7 V " " " " " |
OUT OUT |
" " IN 2.7 V " " " " |
" " " IN 2.7 V " " " |
OUT OUT |
" " " " " " " " |
OUT OUT |
" " " " IN 2.7 V " " |
" " " " " IN 2.7 V 2.7 V |
OUT OUT |
" " " " " " IN 2.7 V |
2.7 V " " " " " " IN |
" " " " " " " " |
1A to 1Y 18 to 1Y 2A to 2Y 28 to 2Y 3A to 3Y 38 to 3Y 4A to 4Y 48 to 4Y |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
|
11 |
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C. |
1/ Case X and 2 terminals not designated are NC.
2/ For circuit C, IOS maximum test limits = -110 mA.
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