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MIL-M-38510-70 Microcircuits, Digital, Bipolar, Schottky Ttl, Nand Gaits, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, Schottky TTL, positive NAND logic gate microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/70C


TABLE II.  Electrical test requirements.



MIL-PRF-38535

Test requirement

Subgroups (see table III)

Class S Devices

Class B Devices

Interim electrical parameters


1


1

Final electrical test

1*, 2, 3,

9, 10, 11

1*, 2, 3, 9

Group A test requirements

1, 2, 3,

9, 10, 11

1, 2, 3,

9, 10, 11

Group B electrical test parameters

when using the  method 5005 QCI option

1, 2, 3,

9, 10, 11


N/A

Groups C end point electrical parameters

1, 2, 3, 9,

10, 11

1, 2, 3

Group D end point electrical  parameters

1, 2, 3

1, 2, 3


* PDA applies to subgroup 1.


3.6  Electrical test requirements.  The electrical test requirements for each device class shall be the subgroups specified in table II.  The electrical tests for each subgroup are described in table III.


3.7  Marking.  Marking shall be in accordance with MIL-PRF-38535.


3.8  Microcircuit group assignment.  The devices covered by this specification shall be in microcircuit group number 8 (see MIL-PRF-38535, appendix A).


4.  PRODUCT ASSURANCE PROVISIONS VERIFICATION


4.1  Sampling and inspection.  Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan.  The modification in the QM plan shall not effect the form, fit, or function as described herein.


4.2  Qualification inspection.  Qualification inspection shall be in accordance with MIL-PRF-38535.

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