MIL-M-38510/508A
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. a. Electrical parameters shall be as specified in table II herein.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The devices selected for testing shall be programmed with a minimum of 50 percent of the total number of cells programmed or to any altered item drawing pattern which includes at least 25 percent of the total number of cells programmed.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional current and positive when flowing into the referenced terminal.
4.6 Programming procedure. The programming procedure shall be as specified by the device manufacturer and shall be made available upon request.
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