MIL-M-38510-40 Microcircuits, Digital, Ttl, High Speed, And-Or-Invert Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, HIGH-SPEED, and-or-invert logic gating microcircuits. One product assurance class and a choice and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number.

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Subgroup

Symbol

MIL- STD-883 method

Cases

A, 8, D

1

2

3

4

5

6

7

8

9

10

11

12

13

14

Measured terminal

Test limits

Unit

Case C

11

12

1

14

13

2

3

4

5

6

7

8

9

10

Test no.

x

x

1A

VCC

18

2A

28

2C

2D

2Y

GND

1Y

1C

1D

Min

Max

1

TC = +25°C

IIH2

3010 "

" " " " " "

31

32

33

34

35

36

37

38

5.5 V GND

5.5 V "

" " " " " "

GND

5.5 V

5.5 V GND

GND

5.5 V

5.5 V GND

GND

5.5 V

GND "

" " " " " "

5.5 V GND

GND

5.5 V

1A

18

1C

1D

2A

28

2C

2D

100 "

" " " " " "

µA "

" " " " " "

IOS

3011

3011

39

40

GND

" "

GND

GND

GND

GND

GND

GND

" "

GND

GND

GND

1Y

2Y

-40

-40

-100

-100

mA "

ICCL

ICCH

3005

3005

41

42

5.5 V GND

" "

5.5 V GND

5.5 V GND

5.5 V GND

5.5 V GND

5.5 V GND

" "

5.5 V GND

5.5 V GND

VCC

VCC

24

13

" "

VIC

43

44

45

46

47

48

49

50

-12 mA

4.5 V "

" " " " " "

-12 mA

-12 mA

-12 mA

-12 mA

-12 mA

" " " " " " " "

-12 mA

-12 mA

1A

18

1C

1D

2A

28

2C

2D

-1.5 "

" " " " " "

V "

" " " " " "

Ix

31

51

1.4 V

GND

"

GND

GND

GND

GND

GND

"

GND

GND

x

-5.85

mA

V8E

41

52

0.7 mA

GND

"

GND

GND

GND

GND

GND

"

20 mA

GND

GND

x

1.1

V

2

Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.

3

Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.