TABLE 111. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high � 2.0 V or low s 0.8 V or open).
Subgroup |
Symbol |
M1L-STD- 883 method |
Cases A,B,C,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Cases 1/ X, 2 |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
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Test no. |
16 |
17 |
NC |
18 |
L E |
L 0 |
GND |
10 |
11 |
12 |
13 |
14 |
15 |
VCC |
Min |
Max |
|||||
9 Tc = 25°C |
tPLH |
3003 Fig. 4 " " |
202 |
0.0 V |
0.0 V |
1N |
0UT |
GND |
2.7 V |
2.7 V |
2.7 V |
2.7 V |
2.7 V |
2.7 V |
5.0 V |
18 to L 0 |
1.5 |
15.0 |
ns |
||
203 |
2.7 V |
0.0 V |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
|||||
204 |
0.0 V |
2.7 V |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
|||||
205 |
2.7 V |
2.7 V |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
|||||
10 |
tPHL |
Same tests and terminal conditions as for subgroup 9, except TC = +125°C and limits as shown. |
1.0 |
21.0 |
" |
||||||||||||||||
tPHL |
1.0 |
20.0 |
" |
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11 |
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C. |
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1/ For cases 2 and X, pins not referenced are N/C.
2/ 11L limits shall be as follows:
Parameters |
Min/Max limits in mA for circuit |
||
A |
B |
C |
|
11L |
-.25/-.60 |
-.03/-.60 |
-.02/+.02 |
3/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
4/ A = 4.5 V, B = 0.0 V,
H � 2.5 V, L s 0.5 V with high speed checker double comparator, or
H > 1.5 V, L < 1.5 V with high speed checker single comparator.
5/ For device type possessing NPN input structure VCC = 0.0 V.
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