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MIL-M-38510-349 Microcircuits, Digital, Bipolar Advanced Schottky Ttl, Parity Checker, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, parity checker microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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TABLE 111. Group A inspection for device type O1 - Continued.

Terminal conditions (pins not designated may be high � 2.O V or low s O.8 V or open).

Subgroup

Symbol

M1L-STD-

883 method

Cases

A,B,C,D

Measured terminal

Limits

Unit

Cases 1/ X, 2

Test no.

L E

L 0

GND

VCC

Min

Max

Tc = 25°C

tPHL

3OO3

Fig. 4 "

" "

" " " "

" " "

2.7 V

0UT

GND

2.7 V

O.O V

5.O V

13 to L E

1.5

16.O

2.7 V

O.O V

2.7 V

O.O V

14 to L E

2.7 V

O.O V

2.7 V

O.O V

15 to L E

2.7 V

O.O V

2.7 V

0UT

O.O V

13 to L 0

2.7 V

O.O V

1OO

O.O V

2.7 V

1O1

2.7 V

1O2

O.O V

14 to L 0

1O3

2.7 V

O.O V

1O4

O.O V

2.7 V

1O5

2.7 V

1O6

O.O V

15 to L 0

1O7

2.7 V

O.O V

1O8

O.O V

2.7 V

1O9

2.7 V

11O

O.O V

0UT

2.7 V

16 to L E

111

2.7 V

O.O V

112

O.O V

2.7 V

113

2.7 V

114

O.O V

17 to L E

115

2.7 V

O.O V

116

O.O V

2.7 V

117

2.7 V

118

O.O V

18 to L E

119

2.7 V

O.O V

12O

O.O V

2.7 V

121

2.7 V

See footnotes at end of table.