MIL-M-38510-349 Microcircuits, Digital, Bipolar Advanced Schottky Ttl, Parity Checker, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, parity checker microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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Test

Symbol

Conditions

-55°C ≤ TC  ≤ +125°C

unless otherwise specified

Device type

Limits

Unit

Min

Max

High level output voltage

VOH

VCC  = 4.5 V, VIL  = 0.8 V, IOH  = -1 mA, VIH  = 2.0 V

01

2.5

V

Low level output voltage

VOL

VCC  = 4.5 V, IOL  = 20 mA, VIH  = 2.0 V, VIL  = 0.8 V

01

0.5

V

Input clamp voltage

VI C

VCC  = 4.5 V, IIN  = -18 mA, TC  = +25°C

01

-1.2

V

Low level input current

IIL

VCC  = 5.5 V, VIN  = 0.5 V

01

+.02

-.60

mA

High level input current

IIH1

VCC  = 5.5 V, VIH  = 2.7 V

01

20

µA

IIH2

VCC  = 5.5 V, VIH  = 7.0 V

01

100

µA

Short circuit output

current   1/

IOS

VCC  = 5.5 V, VOS = 0 V

01

-60

-150

mA

Output drive

IOD

VCC  = 4.5 V, VIN  = 5.5 V, VOUT  = 2.5 V

01

60

mA

Supply current

ICC

VCC  = 5.5 V, VIN  = 0 V

01

40

mA

Propagation delay time low-to-high level

input to output

tPLH

VCC  = 5.0 V, (see figure 4) CL  = 50 pF ±10%,

RL  = 500o

01

1.0

20.0

ns

Propagation delay time, high-to-low level

input to output

tPHL

01

1.0

21.0

ns