TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).
Subgroup |
Symbol |
MIL-ST0- 883 method |
Cases R,S,X,2 |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
19 |
20 |
Measured terminal |
Test limits |
Unit |
|
Test no. |
OE |
00 |
01 |
02 |
03 |
04 |
05 |
06 |
07 |
GN0 |
LE |
Q 7 |
Q 6 |
Q 5 |
Q 4 |
Q 3 |
Q 2 |
Q 1 |
Q 0 |
VCC |
Min |
Max |
|||||
9 Tc = 25°C |
tPZL1 |
3003 Fig. 4 " " " " " " |
148 |
IN |
2.7 V |
GN0 |
2.7 V |
OUT |
5.0 V |
OE to Q 0 |
3.0 |
8.5 |
ns |
||||||||||||||
149 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 1 |
" |
" |
" |
|||||||||||||||||
150 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 2 |
" |
" |
" |
|||||||||||||||||
151 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 3 |
" |
" |
" |
|||||||||||||||||
152 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 4 |
" |
" |
" |
|||||||||||||||||
153 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 5 |
" |
" |
" |
|||||||||||||||||
154 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 6 |
" |
" |
" |
|||||||||||||||||
155 |
" |
2.7 V |
" |
" |
OUT |
" |
OE to Q 7 |
" |
" |
" |
|||||||||||||||||
10 |
Same tests as subgroup 9, except TC = +125°C and use limits from table I. |
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11 |
Same tests as subgroup 10, except TC = -55°C and use limits from table I. |
1/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
2/ IIL limits (mA) min/max values for circuit shown:
Parameter |
Circuit A |
Circuit B |
Circuit C |
IIL |
-.25/-.60 |
-.03/-.60 |
-.03/-.60 |
3/ A = 2.5 V, B = 0.5 V or GN0, H � 2.5 V, L s 0.5 V.
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