MIL-M-38510-346 Microcircuits, Digital, Bipolar, Advanced Schottky Ttl, Transparent And Octal D Type Latches, Cascadable, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced Schottky TTL, octal transparent and octal D type latches three state microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/346C

1.3  Absolute maximum ratings.

Supply voltage range  .............................................................................  -0.5 V dc to +7.0 V dc

Input voltage range  ................................................................................  -1.2 V dc at -18 mA to +7.0 V dc

Storage temperature range  ....................................................................  -65° to +150°C Maximum power dissipation, per device (PD)  1/

Device type 01  .................................................................................  330 mW

Device type 02  .................................................................................  385 mW Device type 03  .................................................................................  336 mW

Device type 04  .................................................................................  303 mW

Lead temperature (soldering, 10 seconds) .............................................  +300°C

Thermal resistance, junction to case (eJC) ..............................................  (See MIL-STD-1835) Junction temperature (TJ) 2/ ...................................................................  175°C

1.4  Recommended operating conditions.

Supply voltage (VCC)  ..............................................................................  4.5 V dc minimum to 5.5 V dc maximum

Minimum high level input voltage (VIH) ...................................................  2.0 V dc Maximum low level input voltage (VIL) ....................................................  0.8 V dc Width of latch enable pulse high tPW(LEH):

Device types 01 and 02 ....................................................................  6.0 ns minimum

Device types 03 and 04 ....................................................................  4.0 ns minimum

Setup time data high to latch enable pulse tS(H):

All device types  ................................................................................  2.0 ns minimum

Setup time data low to latch enable pulse tS(L):

All device types  ................................................................................  2.0 ns minimum

Hold time data high to latch enable pulse tH(H):

Device type 01  .................................................................................  4.0 ns minimum

Device types 02, 03, 04 ....................................................................  3.0 ns minimum

Hold time data low to high latch enable pulse tH(L):

Device types 01 and 04 ....................................................................  4.0 ns minimum

Device types 02 and 03 ....................................................................  3.0 ns minimum

Case operating temperature range (TC)  .................................................  -55° to +125°C

2.  APPLICABLE DOCUMENTS

2.1  General.  The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples.  While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed.

1/  Must withstand the added PD  due to short-circuit test (e.g., IOS).

2/  Maximum junction temperature should not be exceeded except in accordance with allowable short

duration burn-in screening condition in accordance with MIL-PRF-38535.

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