MIL-M-38510-330 Microcircuits, Digital, Bipolar Advanced Schottky Ttl, Nand Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, positive NAND logic gate microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/330C

NOTES:

1. The pulse generator has the following characteristics:

tr = tf � 2.5 ns, PRR = 1 MHz, and ZOUT ≅ 50n.

2. Inputs not under test are at 2.7 V or GND as specified in table III.

3. CL = 50 pF ±10%, including scope probe, wiring, and stray capacitance, without package in test fixture.

4. Voltage measurements are to be made with respect to network ground terminal.

5. RL = 500n ±5 %.

FIGURE 3. Switching time test circuit (all device types).