TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high � 2.0 V, or low s 0.7 V, or open).
1/ Case X and 2 pins not referenced are NC.
2/ Apply 4.5 V pulse, then ground prior to taking measurements to set device in the desired state. Maintain ground measurement.
3/ Input pulse must be applied one time after R0 pulse.
4/ Input pulse must be applied twice after R0 pulse.
5/ Input pulse must be applied four times after R0 pulse.
6/ IIL limits are as follows:
Test |
Min/Max limits for circuits |
||||
A |
B |
C |
E |
F |
|
IIL1 |
-120/-360 µA |
-30/-400 µA |
-30/-400 µA |
-120/-360 µA |
-120/-400 µA |
IIL2 |
-0.5/-2.0 mA |
-1.0/-2.4 mA |
-1.0/-2.4 mA |
-0.5/-2.0 mA |
-1.0/-2.4 mA |
IIL3 |
-0.4/-1.6 mA |
-0.4/-1.6 mA |
-0.7/-3.2 mA |
-0.4/-1.6 mA |
-.65/-1.6 mA |
7/ IOS limits for circuit C are -30/-130 mA.
8/ A = 2.5 V minimum, B = 0.4 V.
9/ Output voltages shall be either:
a. H � 1.5 V
b. L s 1.5 V
10/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one half of the input frequency.
11/ When testing tPHL1 or tPLH1, the QA pin shall be connected to the input B pin.
12/ Momentary 3.0 V (min), then ground. Maintain ground for measurement.
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