MIL-M-38510-320 Microcircuits, Digital, Bipolar Low-Power Schottky Ttl. Counters, Cascadable, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, binary and decade counters. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M- 38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/320D

TABLE I. Electrical performance characteristics.

Test	Symbol	Conditions -55°C ≤ TC ≤ +125°C unless otherwise specified	Device types	Limits		Unit
Test	Symbol	Conditions -55°C ≤ TC ≤ +125°C unless otherwise specified	Device types	Min	Max	Unit
Low level input current at CP1	IIL6	VCC = 5.5 V, VIN = 0.4 V	01	-0.4	-3.2	mA
Low level input current at CP1	IIL6	VCC = 5.5 V, VIN = 0.4 V	02	-0.4	-1.6	mA
Short circuit output current	IOS	VCC = 5.5 V 2/	01, 02	-15	-100	mA
Short circuit output current	IOS	VCC = 5.5 V 2/	03, 04	-15	-130	mA
Supply current	ICC	VCC = 5.5 V, VIN = 0 V 3/	01, 02		27	mA
Supply current	ICC	VCC = 5.5 V, VIN = 0 V 3/	03, 04		15	mA
Maximum count frequency at input CPo	fMAX	VCC = 4.5 V, CL = 50 pF ±10% RL = 2 kn	01, 02	30		MHz
Maximum count frequency at input CP1	fMAX	VCC = 4.5 V, CL = 50 pF ±10% RL = 2 kn	01, 02	15		MHz
Maximum input A count frequency	fMAX	VCC = 5.0 V, CL = 50 pF ±10%, RL = 2 kn	03, 04	29		MHz
Propagation delay time low to high, A to QC	tPLH1 4/		03, 04	3	74	ns
Propagation delay time high to low, A to QC	tPHL1 4/		03, 04	3	81	ns
Propagation delay time low to high, B to QD	tPLH2		03	3	52	ns
Propagation delay time low to high, B to QD	tPLH2		04	3	78	ns
Propagation delay time high to low, B to QD	tPHL2		03	3	56	ns
Propagation delay time high to low, B to QD	tPHL2		04	3	78	ns
Propagation delay time low to high, CPo to Q2	tPLH3 5/		01, 02	3	100	ns
Propagation delay time high to low, CPo to Q2	tPHL3 5/		01, 02	3	107	ns
Propagation delay time low to high, CP1 to Q3	tPLH4		01	3	38	ns
Propagation delay time low to high, CP1 to Q3	tPLH4		02	3	78	ns
Propagation delay time high to low, CP1 to Q3	tPHL4		01	3	52	ns
Propagation delay time high to low, CP1 to Q3	tPHL4		02	3	110	ns
Propagation delay time low to high, load to Q	tPLH5		01, 02	3	46	ns
Propagation delay time high to low, load to Q	tPHL5		01, 02	3	65	ns
Propagation delay time high to low, reset to Q	tPHL6		02	3	46	ns

1/ Input B ( CP1 ) is connected to QA (Q0) during the VOL test.

2/ Not more than one output should be shorted at a time.

3/ ICC is measured with all outputs open, both Ro inputs grounded following momentary connection to 4.5 V and all other inputs grounded.

4/ When testing tPHL1 or tPLH1, the QA pin shall be connected to the input B pin.

5/ When testing tPHL3 or tPLH3, the Q0 pin shall be connected to the CP1 pin.