TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high 2.0 V; low σ 0.7 V; or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases E, F |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Measured terminal |
Limits |
Unit |
|
Cases 1/ 2, X |
2 |
3 |
4 |
5 |
7 |
8 |
9 |
10 |
12 |
13 |
14 |
15 |
17 |
18 |
19 |
20 |
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Test no. |
B3 |
A < B IN |
A = B IN |
A > B IN |
A > B OUT |
A = B OUT |
A < B OUT |
GND |
B0 |
A0 |
B1 |
A1 |
A2 |
B2 |
A3 |
VCC |
Min |
Max |
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9 Tc = 25°C |
tPHL1 |
3003 Fig. 4 " " " " " " |
108 |
IN |
GND |
GND |
OUT |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
2.7 V |
5.0 V |
B3 to A < B |
2 |
35 |
ns |
|||
109 |
GND |
" |
" |
" |
" |
IN |
2.7 V |
" |
" |
" |
" |
GND |
" |
B0 to A < B |
" |
" |
" |
||||||
110 |
" |
GND |
" |
OUT |
" |
2.7 V |
IN |
" |
" |
" |
" |
" |
" |
A0 to A > B |
" |
" |
" |
||||||
111 |
" |
" |
GND |
OUT |
" |
GND |
GND |
IN |
2.7 V |
" |
" |
" |
" |
B1 to A < B |
" |
" |
" |
||||||
112 |
" |
GND |
" |
OUT |
" |
" |
" |
2.7 V |
IN |
" |
" |
" |
" |
A1 to A > B |
" |
" |
" |
||||||
113 |
" |
" |
" |
" |
" |
" |
" |
GND |
GND |
IN |
2.7 V |
" |
" |
A2 to A > B |
" |
" |
" |
||||||
114 |
" |
" |
GND |
OUT |
" |
" |
" |
" |
" |
2.7 V |
IN |
" |
" |
B2 to A < B |
" |
" |
" |
||||||
115 |
2.7 V |
GND |
OUT |
" |
" |
" |
" |
" |
GND |
GND |
IN |
" |
A3 to A > B |
" |
" |
" |
|||||||
tPHL2 |
" " " " " " " " |
116 |
IN |
2.7 V |
OUT |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
B3 to A = B |
" |
33 |
" |
|||||
117 |
GND |
" |
" |
" |
IN |
" |
" |
" |
" |
" |
" |
" |
B0 to A = B |
" |
" |
" |
|||||||
118 |
" |
" |
" |
" |
GND |
IN |
" |
" |
" |
" |
" |
" |
A0 to A = B |
" |
" |
" |
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119 |
" |
" |
" |
" |
" |
GND |
IN |
" |
" |
" |
" |
" |
B1 to A = B |
" |
" |
" |
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120 |
" |
" |
" |
" |
" |
" |
GND |
IN |
" |
" |
" |
" |
A1 to A = B |
" |
" |
" |
|||||||
121 |
" |
" |
" |
" |
" |
" |
" |
GND |
IN |
" |
" |
" |
A2 to A = B |
" |
" |
" |
|||||||
122 |
" |
" |
" |
" |
" |
" |
" |
" |
GND |
IN |
" |
" |
B2 to A = B |
" |
" |
" |
|||||||
123 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
GND |
IN |
" |
A3 to A = B |
" |
" |
" |
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tPHL3 |
" " |
124 |
" |
IN |
GND |
OUT |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
A<B to A>B |
" |
20 |
" |
||||
125 |
" |
GND |
IN |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A=B to A>B |
" |
" |
" |
||||||
tPHL5 |
" " |
126 |
" |
IN |
GND |
OUT |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A=B to A<B |
" |
20 |
" |
||||
127 |
" |
GND |
IN |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A>B to A<B |
" |
" |
" |
||||||
tPHL4 |
" |
128 |
" |
IN |
OUT |
" |
" |
" |
" |
" |
" |
" |
" |
" |
A=B to A=B |
" |
25 |
" |
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10 |
Same tests and terminal conditions as for subgroup 9, except TC = +125°C and test limits as follows: in minimum limits column limits for all tests are 2 ns; in maximum limits column, limits for tPLH1 and tPLH2 are 42 ns; tPLH3 are 25 ns, tPLH5 are 30 ns, tPLH4 are 28 ns tPHL1 are 42 ns, tPHL2 are 39 ns, tPHL3 are 28 ns, tPHL5 are 26 ns, tPHL4 are 36 ns. |
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11 |
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C. |
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1/ Case X and 2 pins not referenced are NC.
2/ For circuit F, IIL1 limits are -0.5 to -400 μA. For circuit B, IIL1 limits are -180 to -420 μA.
3/ IIL2 limits (mA) min/max values for circuits shown:
Measured Terminal |
Circuit |
|||||
A |
B |
C |
D |
E |
F |
|
B3 |
-0.03/-.30 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
A = B IN |
-.32/-1.14 |
-.40/-1.3 |
-.32/-1.2 |
-.32/-1.14 |
-.32/-1.14 |
-.14/-1.14 |
B0 |
-.20/-.60 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
A0 |
-.20/-.60 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
B1 |
-.40/-1.14 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
A1 |
-.40/-1.14 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
A2 |
-.40/-1.14 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
B2 |
-.40/-1.14 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
A3 |
-.20/-.60 |
-.40/-1.3 |
-.40/-1.2 |
-.40/-1.14 |
-.40/-1.14 |
-.28/-1.14 |
4/ For circuit B, IOS limits are -30 to -130 mA.
5/ Tests shall be performed in sequence.
6/ A = 3.0 V min;, B = 0.0 V or GND; H > 1.5 V; L < 1.5 V.
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