MIL-M-38510-3 Microcircuits, Digital, Bipolar, Ttl, Nand Buffers Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, positive NAND buffer microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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Subgroup

Symbol

MIL-STD-

883 method

Cases

A,8,D

1

2

3

4

5

6

7

8

9

10

11

12

13

14

Measured terminal

Limits

Unit

Case

C

1

2

3

4

5

6

7

8

9

10

11

12

13

14

Min

Max

Test no.

1A

18

1Y

2A

28

2Y

GND

3Y

3A

38

4Y

4A

48

VCC

2

Same tests, terminal conditions and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.

3

Same tests, terminal conditions and limits as for subgroup 1, except TC = -55°C and VIC   tests are omitted.

9

Tc = +25°C

tPHL

3003

(Fig. 3)

" "

47

48

49

50

IN

2.4 V

OUT

IN

2.4 V

OUT

GND

"

" "

OUT

IN

2.4 V

OUT

IN

2.4 V

5.0 V

"

" "

1A to 1Y

2A to 2Y

3A to 3Y

4A to 4Y

3

"

" "

25

"

" "

ns

"

" "

tPLH

3003 (Fig. 3) "

"

51

52

53

54

IN

2.4 V

OUT

IN

2.4 V

OUT

" " " "

OUT

IN

2.4 V

OUT

IN

2.4 V

" " " "

1A to 1Y

2A to 2Y

3A to 3Y

4A to 4Y

" " " "

22 "

" "

" " " "

10

Tc = +125°C

tPHL

3003 (Fig. 3) "

"

55

56

57

58

IN

2.4 V

OUT

IN

2.4 V

OUT

GND "

" "

OUT

IN

2.4 V

OUT

IN

2.4 V

" " " "

1A to 1Y

2A to 2Y

3A to 3Y

4A to 4Y

" " " "

38 "

" "

" " " "

tPLH

3003 (Fig. 3) "

"

59

60

61

62

IN

2.4 V

OUT

IN

2.4 V

OUT

" " " "

OUT

IN

2.4 V

OUT

IN

2.4 V

" " " "

1A to 1Y

2A to 2Y

3A to 3Y

4A to 4Y

" " " "

30 "

" "

" " " "

11

Same tests, terminal conditions and limits as for subgroup 10, except TC =  -55° C.