MIL-M-38510-3 Microcircuits, Digital, Bipolar, Ttl, Nand Buffers Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, positive NAND buffer microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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Subgroup

Symbol

MIL-STD-

883 method

Cases

A,B,D

1

2

3

4

5

6

7

8

9

10

11

12

13

14

Measured terminal

Limits

Unit

Case

C

1

6

3

14

11

9

10

12

13

8

7

2

4

5

Min

Max

Test no.

1A

1Y

NC

VCC

NC

2A

2B

2C

2D

2Y

GND

1B

1C

1D

2

Same tests, terminal conditions and limits as for subgroup 1, except TC = 125° C, and VI C tests are omitted.

3

Same tests, terminal conditions and limits as for subgroup 1, except TC =  -55° C, and VI C tests are omitted.

9

Tc = +25°C

tPHL tPHL tPLH tPLH

3003 (Fig. 3) "

"

47

48

IN

OUT

5.0 V "

IN

2.4 V

2.4 V

2.4 V

OUT

GND "

2.4 V

2.4 V

2.4 V

1A to 1Y

2A to 2Y

3 "

25

25

ns

"

49

50

IN

OUT

" "

IN

2.4 V

2.4 V

2.4 V

OUT

" "

2.4 V

2.4 V

2.4 V

1A to 1Y

2A to 2Y

" "

22

22

" "

10

Tc = +125°C

tPHL tPHL tPLH tPLH

3003 (Fig. 3) "

"

51

52

IN

OUT

" "

IN

2.4 V

2.4 V

2.4 V

OUT

"

2.4 V

2.4 V

2.4 V

1A to 1Y

2A to 2Y

" "

30

30

" "

53

54

IN

OUT

" "

IN

2.4 V

2.4 V

2.4 V

OUT

" "

2.4 V

2.4 V

2.4 V

1A to 1Y

2A to 2Y

" "

27

27

" "

11

Same tests, terminal conditions and limits as for subgroup 10, except TC   = -55°C.