TA8LE III. Group A inspection for device type 03 - Continued.
Symbol |
MIL- STD-833 method |
Cases C,D, T, and Y |
Terminal conditions 11 |
Measured terminal |
Test limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Subgroup 9 TA = 25°C |
Subgroup 10 TA = 125°C |
Subgroup 11 TA = -55°C |
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Symbol |
2A |
28 |
1A |
18 |
1C |
1Y |
VSS |
2C |
2Y |
3Y |
3A |
38 |
3C |
VDD |
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Test No. |
Min |
Max |
Min |
Max |
Min |
Max |
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tTLH " " " " " " " " |
3004 Fig. 3 " " " " " " " |
151 152 153 154 155 156 157 158 159 |
IN 5.0V " " " " " " " |
5.0V IN 5.0V " " " " " " |
5.0V " " IN 5.0V " " " ‘ |
5.0V " " " IN 5.0V " " " |
5.0V " " " " IN 5.0V " " |
OUT " " |
GND " " " " " " " " |
5.0V 5.0V IN 5.0V " " " " " |
OUT " " |
OUT " " |
5.0V " " " " " IN 5.0V 5.0V |
5.0V " ‘ " " " " IN 5.0V |
5.0V " " " " " " " IN |
5.0V " " " " " " " " |
2Y 2Y 2Y 1Y 1Y 1Y 3Y 3Y 3Y |
10 " " " " " " " " |
200 " " " " " " " " |
14 " " " " " " " " |
280 " " " " " " " " |
10 " " " " " " " " |
200 " " " " " " " " |
ns " " " " " " " " |
Subgroup 12 TA = 25°C |
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Min |
Max |
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tPHL " " " " " " " " |
3003 Fig. 3 " " " " " " " |
160 161 162 163 164 165 166 167 168 |
IN 10.0V " " " " " " " |
10.0V IN 10.0V " " " " " " |
10.0V 10.0V 10.0V IN 10.0V " " " " |
10.0V " " " IN 10.0V " " " |
10.0V " " " " IN 10.0V " " |
OUT " " |
GND " " " " " " " " |
10.0V 10.0V IN 10.0V " " " " " |
OUT " " |
OUT " " |
10.0V " " " " " IN 10.0V " |
10.0V " " " " " " IN 10.0V |
10.0V " " " " " " " IN |
10.0V " " " " " " " " |
2A to 2Y 28 to 2Y 2C to 2Y 1A to 1Y 18 to 1Y 1C to 1Y 3A to 3Y 38 to 3Y 3C to 3Y |
6 " " " " " " " " |
120 " " " " " " " " |
ns " " " " " " " " |
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tPLH " " " " " " " " |
" " " " " " " " " |
169 170 171 172 173 174 175 176 177 |
IN 10.0V " " " " " " " |
" IN 10.0V " " " " " " |
" " " IN 10.0V " " " " |
" " " " IN 10.0V " " " |
" " " " " IN 10.0V " " |
OUT " " |
" " " " " " " " " |
" " IN 10.0V " " " " " |
OUT " " |
OUT " " |
" " " " " " IN 10.0V " |
" " " " " " " IN 10.0V |
10.0V " " " " " " " IN |
" " " " " " " " " |
2A to 2Y 28 to 2Y 2C to 2Y 1A to 1Y 18 to 1Y 1C to 1Y 3A to 3Y 38 to 3Y 3C to 3Y |
" " " " " " " " " |
" " " " " " " " " |
" " " " " " " " " |
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tTHL " " " " " " " " |
3004 Fig. 3 " " " " " " " |
178 179 180 181 182 183 184 185 186 |
IN 10.0V " " " " " " " |
" IN 10.0V " " " " " " |
" " " IN 10.0V " " " " |
" " " " IN 10.0V " " " |
" " " " " IN 10.0V " " |
OUT " " |
" " " " " " " " " |
" " IN 10.0V " " " " " |
OUT " " |
OUT " " |
" " " " " " IN 10.0V " |
" " " " " " " IN 10.0V |
10.0V " " " " " " " IN |
" " " " " " " " " |
2Y 2Y 2Y 1Y 1Y 1Y 3Y 3Y 3Y |
5 " " " " " " " " |
100 " " " " " " " " |
" " " " " " " " " |
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tTLH " " " " " " " " |
" " " " " " " " " |
187 188 189 190 191 192 193 194 195 |
IN 10.0V " " " " " " " |
" IN 10.0V " " " " " " |
" " " IN 10.0V " " " " |
" " " " IN 10.0V " " " |
" " " " " IN 10.0V " " |
OUT " " |
" " " " " " " " " |
" " IN 10.0V " " " " " |
OUT " " |
OUT " " |
" " " " " " IN 10.0V 10.0V |
" " " " " " " IN 10.0V |
10.0V " " " " " " " IN |
" " " " " " " " " |
2Y 2Y 2Y 1Y 1Y 1Y 3Y 3Y 3Y |
" " " " " " " " " |
" " " " " " " " " |
" " " " " " " " " |
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11 Pins not designated may be "HIGH" level logic, "LOW" level logic or open. Exceptions are as follows: VIC(pos) tests, the VSS terminals shall be open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output terminals shall be open.
21 The ISS measurements shall be performed in sequence.
31 The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
41 See 4.4.1c.
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