MIL-M-38510-170 Microcircuits, Digital, Cmos, And Gates, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/170C

1.3 Absolute maximum ratings.

Supply voltage range (VDD - VSS)....................................................... -0.5 V dc to +18.0 V dc

Input current (each input) .................................................................. ±10 mA

Input voltage range ........................................................................... (VSS - 0.5 ) ≤ VI ≤ (VDD + 0.5) Storage temperature range (TSTG).................................................... -65° to +175°C

Maximum power dissipation (PD) ..................................................... 200 mW Lead temperature (soldering, 10 seconds) ....................................... +300°C

Thermal resistance, junction to case (εJC)......................................... See MIL-STD-1835

Junction temperature (TJ) ................................................................. 175°C

1.4 Recommended operating conditions.

Supply voltage range (VDD - VSS)....................................................... 4.5 V dc to 15.0 V dc

Input low voltage range (VIL) ............................................................. VOL = 10% VDD, VOH = 90% VDD

0.0 V to 1.5 V dc @ VDD = 5.0 V

0.0 V to 2.0 V dc @ VDD = 10.0 V dc

0.0 V to 4.0 V dc @ VDD = 15.0 V dc

Input high voltage range (VIH)............................................................ VOL = 10% VDD, VOH = 90% VDD

3.5 V to 5.0 V dc @ VDD = 5.0 V

8.0 V to 10.0 V dc @ VDD = 10.0 V dc

11 V to 15.0 V dc @ VDD = 15.0 V dc

Operating temperature range (TA) .................................................... -55°C to +125°C

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.