MIL-M-38510-161 Microcircuits, Digital, Bipolar, Ttl, Common Or Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, positive OR logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/161A

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements	Subgroups (see table III)
MIL-PRF-38535 test requirements	Class B devices	Class S devices
Interim electrical parameters	1	1
Final electrical test parameters	1*, 2, 3, 9	1*, 2, 3, 9, 10, 11
Group A test requirements	1, 2, 3, 9	1, 2, 3, 9, 10, 11
Group B electrical test parameters when using method 5005 QCI option	N/A	1, 2, 3
Group C end-point electrical parameters	1, 2, 3	1, 2, 3
Additional electrical subgroups for group C periodic inspections	10, 11	N/A
Group D end-point electrical parameters	1, 2, 3	1, 2, 3

* PDA applies to subgroup 1.

4.5 Methods of inspection. Methods of inspection shall be as specified and as follows:

4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional current and positive when flowing into the referenced terminal.