MIL-M-38510-161 Microcircuits, Digital, Bipolar, Ttl, Common Or Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, positive OR logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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Test

Symbol

Conditions   1/

-55°C ≤ TA ≤ +125°C

unless otherwise specified

Device type

Limits

Unit

Min

Max

High level output voltage

VOH

VCC = 4.5 V, VIN = 2.0 V, IOH = -800 µA

01

2.4

V

Low level output voltage

VOL

VCC = 4.5 V, IOL = 16 mA, VIN = 0.8 V

01

0.4

V

Input clamp voltage

VIC

VCC = 4.5 V, IIN = -12 mA, TA = 25°C

01

-1.5

V

High level input current

IIH1

VCC = 5.5 V, VIN = 2.4 V

01

40

µA

High level input current

IIH2

VCC = 5.5 V, VIN = 5.5 V

01

100

µA

Low level input current

IIL

VCC = 5.5 V, VIN = 0.4 V

01

-0.7

-1.6

mA

Short circuit output current

IOS

VCC = 5.5 V   2/

01

-20

-55

mA

High level supply current

ICCH

VCC = 5.5 V, VIN = 5.5 V

01

22

mA

Low level supply current

ICCL

VCC = 5.5 V, VIN = 0 V

01

38

mA

Propagation delay time, high to low level

tPHL

CL = 50 pF, RL = 390 n

01

3

27

ns

Propagation delay time, low to high level

tPLH

CL = 50 pF, RL = 390 n

01

3

25

ns