MIL-M-38510-155 Microcircuits, Digital, Ttl, High Speed, And Gates Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, TTL, high speed positive AND logic gating microcircuits. One product assurance class and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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Test

Symbol

Conditions   1/

-55°C ≤ TC ≤ +125°C

unless otherwise specified

Device type

Limits

Unit

Min

Max

High level output voltage

VOH

VCC = 4.5 V, VIN = 2.0 V,

IOH = -500 µA for all inputs of gate under test

All

2.4

V

Low level output voltage

VOL

VCC = 4.5 V, IOL = 20 mA,

VIN = 0.8 V for all inputs of gate under test

All

0.4

V

Input clamp voltage

VIC

VCC = 4.5 V, IIN = -8 mA, TC = 25°C

All

-1.5

V

High level input current

IIH1

VCC = 5.5 V, VIN = 2.4 V

All

50

µA

High level input current

IIH2

VCC = 5.5 V, VIN = 5.5 V

All

100

µA

Low level input current

IIL

VCC = 5.5 V, VIN = 0.4 V

All

-0.7

-2.0

mA

Short circuit output current

IOS

VCC = 5.5 V   2/

All

-40

-100

mA

High level supply current

ICCH

VCC = 5.5 V, VIN = 5.5 V

01,04

40

mA

02

30

03

20

Low level supply current

ICCL

VCC = 5.5 V, VIN = 0 V

01,04

64

mA

02

48

03

32

Propagation delay time, high to low level

tPHL

CL = 50 pF, RL = 280 n

All

3

16

ns

Propagation delay time, low to high level

tPLH

CL = 50 pF, RL = 280 n

All

3

16

ns