MIL-M-38510-139 Microcircuits, Linear, Internally Trimmed Analog Multiplier, Hybrid And Monolithic SiliconThis specification covers the detail requirements for monolithic and hybrid silicon, internally trimmed analog multipliers. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/139C

4.4.1  Group A inspection.  Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a.    Tests shall be as specified in table II herein. b.    Subgroups 8, 10, and 11 shall be omitted.

4.4.2  Group B inspection.  Group B inspection shall be in accordance with table II of MIL-PRF-38535.

4.4.3  Group C inspection.  Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:

a.    End point electrical parameters shall be as specified in table II herein.

b.    The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as

specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535.  The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.  The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test

method 1005 of MIL-STD-883.

4.4.4  Group D inspection.  Group D inspection shall be in accordance with table V of MIL-PRF-38535.  End point electrical parameters shall be as specified in table II herein.

4.5  Methods of inspection.  Methods of inspection shall be specified and as follows.

4.5.1  Voltage and current.  All voltage values given are referenced to the microcircuit ground terminals.  Currents given are conventional current and positive when flowing into the referenced terminal.

4.6  Data reporting.  When specified in the acquisition document, a copy of the following data, as applicable, shall be applied:

a.        Attributes data for all screening tests (see 4.2) and variables data for all static burn-in, dynamic burn-in, and operating life tests.

b.    A copy of each radiograph.

c.    The quality conformance inspection data (see 4.4).

d.    Parameter distribution data on parameters evaluated during burn-in (see 3.5). e.    Final electrical parameter data (4.2b).

Table IV.  Group C end-point electrical parameters.  TA = 25°C, VS  = ±15 V dc, VOS = GND

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