MIL-M-38510/1188
Device table |
||||
Device type |
01 |
02 |
03 |
04 |
R1 |
549 n |
549 n |
249 n |
249 n |
R2 |
442 n |
442 n |
0 n |
0 n |
RL |
10 n |
5 n |
2.5 n |
0.833 n |
Ci, CL |
2.0 µF |
2.0 µF |
10.0 µF |
10.0 µF |
FIGURE 9. Test circuit for static tests.
23
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