MIL-M-38510-112 Microcircuits, Linear, Voltage Comparators, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, voltage comparators. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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TABLE III. Group A inspection - Continued.

Subgroup	Symbol	MIL-STD- 883 method	Test No.	1/ Notes	Adapter pin numbers										Energized relays	Measured pin			Equation	Limits		Unit
					1	2	3	4	5	6	7	8	9	10		No.	Value	Unit		Min	Max
8 TA = 125°C	tRLH tRLH tRHL tRHL		99		+VCC = 5 V; VlN = 100 mV RL = 5.1 Kν Figure 3												VOD = 5 mV		See response time Waveforms		7	∝s
			100														VOD = 50 mV				1.2
			101														VOD = 5 mV				3
			102														VOD = 50 mV				1
8 TA = -55°C	tRLH tRLH tRHL tRHL		103		+VCC = 5 V; VlN = 100 mV RL = 5.1 Kν Figure 3												VOD = 5 mV		See response time Waveforms		5	∝s
			104														VOD = 50 mV				0.8
			105														VOD = 5 mV				2.5
			106														VOD = 50 mV				0.8
9 TA = 25°C	VLAT		107		+VCC = 5 V; Figure 5 IO = 4 mA																0.4	V
			108																		0.4
			109																		0.4
			110																		0.4

1/ For devices marked with the "Q" certification mark, the parameters used herein may be guaranteed if not tested to the limits specified in accordance with the manufacturer's QM plan.

2/ VlO, IlO, +IlB AND -IlB measured over the common mode range for 30 V and 5 V power supply conditions.

3/ CMR is calculated for 30 V and 5 V power supply conditions.

4/ ICEX is measured with the output in the high state (VOH) and connected to +30 V.

5/ ICC is measured at no load, but with the output of each op amp in its low state.

6/ AVS is measured with a 15 kν pullup resistor between the output levels of 1 V and 11 V.

7/ Tests 30, 35, 57 and 62 which require a read and record measurement plus a calculation may be omitted except when subgroup 2 and 3 are being accomplished for group A sampling inspection and groups C and D end point measurements.

8/ +IlL is measured with +34 V on the + input and 0 V on the - input. -IlL is measured with +34 V on the - input and 0 V on the + input.

9/ Common mode refection is calculated using the offset voltage values measured at the common mode range end points.

10/ Each device shall be tested over the common mode range as specified in table III with the output forced to voltage midway between +VCC and -VCC supplies. VCM is achieved by grounding the inputs and algebraically subtracting VCM from each supply. Common mode refection is calculated using offset voltage values measured at the common mode rejection end points.

11/ Relays K1 thru K4 select comparator under test.

12/ Each comparator shall be tested separately, except for the ICC measurements where all comparators shall be connected as grounded followers.