MIL-M-38510-352 Microcircuits, Digital, Bipolar Advanced Schottky Ttl, Nand Buffers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, NAND buffers. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19

Subgroup

Symbol

MIL-STD-

883 method

Cases

C,D

1

2

3

4

5

6

7

8

9

10

11

12

13

14

Measured terminal

Limits

Unit

Case 11

2

2

3

4

6

8

9

10

12

13

14

16

18

19

20

Test no.

A1

B1

Y1

A2

B2

Y2

GND

Y3

B3

A3

Y4

B4

A4

VCC

Min

Max

1

Tc = 25°C

ICEX

3009

" " " "

" " "

41

5.5 V

0.8 V

4.5 V

5.5 V

5.5 V

GND

5.5 V

5.5 V

5.5 V

5.5 V

4.5 V

Y1

250

µA

42

0.8 V

5.5 V

4.5 V

5.5 V

"

"

"

"

"

"

"

Y1

"

"

43

5.5 V

"

0.8 V

"

4.5 V

"

"

"

"

"

"

Y2

"

"

44

"

"

5.5 V

0.8 V

4.5 V

"

"

"

"

"

"

Y2

"

"

45

"

"

"

5.5 V

"

4.5 V

"

0.8 V

"

"

"

Y3

"

"

46

"

"

"

"

"

4.5 V

0.8 V

5.5 V

"

"

"

Y3

"

"

47

"

"

"

"

"

5.5 V

"

4.5 V

"

0.8 V

"

Y4

"

"

48

"

"

"

"

"

"

"

4.5 V

0.8 V

5.5 V

"

Y4

"

"

ICCL

3005

49

"

"

"

"

"

"

"

5.5 V

5.5 V

5.5 V

VCC

30

mA

ICCH

3005

50

0.0 V

0.0 V

0.0 V

0.0 V

"

0.0 V

0.0 V

0.0 V

0.0 V

5.5 V

VCC

7

mA

2

Same tests, terminal conditions and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.

3

Same tests, terminal conditions and limits as for subgroup 1, except TC = 55°C and VIC tests are omitted.

7

Tc = 25°C

Func-

tional tests

41

3014

" " "

51

B

B

H

B

B

H

GND

H

B

B

H

B

B

31

All

52

A

B

"

A

B

"

"

"

B

A

"

B

A

"

outputs

53

B

A

"

B

A

"

"

"

A

B

"

A

B

"

"

54

A

A

L

A

A

L

"

L

A

A

L

A

A

"

"

9

Tc = 25°C

tPLH

3003

Fig. 3 "

" " " "

"

55

IN

2.7 V

OUT

GND

5.0 V

A1 to  Y1

6.5

12.5

ns

56

2.7 V

IN

OUT

"

"

B1 to  Y1

"

"

"

57

IN

2.7 V

OUT

"

"

A2 to  Y2

"

"

"

58

2.7 V

IN

OUT

"

"

B2 to  Y2

"

"

"

59

"

OUT

2.7 V

IN

"

A3 to  Y3

"

"

"

60

"

OUT

IN

2.7 V

"

B3 to  Y3

"

"

"

61

"

OUT

2.7 V

IN

"

A4 to  Y4

"

"

"

62

"

OUT

IN

2.7 V

"

B4 to  Y4

"

"

"

tPHL

" " " " "

" "

"

63

IN

2.7 V

OUT

"

"

A1 to  Y1

1.0

5.0

"

64

2.7 V

IN

OUT

"

"

B1 to  Y1

"

"

"

65

IN

2.7 V

OUT

"

"

A2 to  Y2

"

"

"

66

2.7 V

IN

OUT

"

"

B2 to  Y2

"

"

"

67

"

OUT

2.7 V

IN

"

A3 to  Y3

"

"

"

68

"

OUT

IN

2.7 V

"

B3 to  Y3

"

"

"

69

"

OUT

2.7 V

IN

"

A4 to  Y4

"

"

"

70

"

OUT

IN

2.7 V

"

B4 to  Y4

"

"

"

10

Same tests and terminal conditions as for subgroup 9, except TC =  +125° C and use limits from table I.

11

Same tests, terminal conditions and limits as for subgroup 10, except TC =  -55° C.