MIL-M-38510-339 Microcircuits, Digital, Bipolar, Advanced Schottky Ttl, Data Selectors/Multiplexers With Three-State Outputs, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced Schottky TTL, data selectors and multiplexers three-state microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/339E

Test Circuit

NOTES:

1. VIN input pulse has the following characteristics: t1 = t0 ≤ 2.5 ns, PRR ≤ 1 MHz, ZOUT � 50n.

2. Inputs not under test are at ground.

3. CL = 50 pF ±10% including scope probe, wiring and stray capacitance without package in test fixture.

4. R1 = R2 = 499n ±5%.

5. Voltage measurements are to be made with respect to network ground terminal.

FIGURE 4. Switching time test circuit and waveform for all device types.