MIL-M-38510-231 Microcircuits, Digital, Schottky Ttl, 1024 Bit Random Access Memory Ram, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, Schottky TTL, static, 1024 bit random access memory microcircuits. Two product assurance classes and a choice of case outlines/lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/231C

TABLE I. Electrical performance characteristics.

Test	Symbol	Conditions 1/ -55°C ≤ TC ≤ +125°C unless otherwise specified	Device Type	Limits		Units
				Min	Max
Data setup time prior to write	tDCWL	VCC = 4.5 V and 5.5 V CL = 30 pF See figure 5	01, 02, 05, 06- 12, 14, 15	5		ns
			03, 04, 13	10
Data hold time after write	tWHDC		01, 02, 05-15	5		ns
			03, 04	10
Address setup time prior to write	tAVWL		01, 02	15		ns
			03-06, 09-13, 15	10
			07, 08, 14	5
Address hold time after write	tWHAC		01, 02, 07, 08, 13, 14, 15	5		ns
			03-06, 09-12	10
Chip select setup time prior to write	tSVWL		01, 02, 05-12, 14, 15	5		ns
			03, 04, 13	10
Chip select hold time after write	tWHSC		01, 02, 05-15	5		ns
			03, 04	10
Write enable time to high impedence	tWLQZ		02, 04, 06, 10, 12,13, 14, 15		45	ns
			08		35
Chip select disable time to high impedance	tSCQZ		01, 05, 02, 04, 06		50	ns
			07, 08, 13, 14		35
			09, 10, 11, 12		45
			15		40

1/ Complete terminal conditions shall be specified in table III.

2/ Not more than one output shall be shorted at one time.

3/ ICC is measured with all inputs grounded for device types 01-08 and 13; and all inputs and outputs open for device types 09-12, 14, and 15.