MIL-M-38510-18 Microcircuits, Digital, Ttl, Register File, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, TTL, bistable logic gating microcircuits. One product assurance class and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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Test

Symbol

Conditions  1/

Limits

Unit

Min

Max

Low-level output voltage

VOL

VCC = 4.5 V, IOL = 16 mA

0.4

V

Maximum collector cut-off current

ICEX

VCC = 4.5 V, V0 = 5.5 V

30

µA

Input clamp voltage

VIC

VCC = 4.5 V, IIN = 12 mA

-1.5

V

Low-level input current

IIL

VCC = 5.5 V, VIN = 0.4 V

-0.7

-1.6

mA

High-level input current

IIH1

VCC = 5.5 V, VIN = 2.4 V

40

µA

IIH2

VCC = 5.5 V, VIN = 5.5 V

100

µA

Supply current

ICC

VCC = 5.5 V

140

mA

Propagation delay time, Read enable to any output

tPLH1

VCC = 5.0 V, RL = 4000, CL = 50 pF

5

18

ns

tPHL1

5

36

ns

Propagation delay time, Write enable to any output

tPLH2

5

48

ns

tPHL2

5

54

ns

Propagation delay time,

Read address to any output

tPLH3

5

42

ns

tPHL3

5

54

ns

Propagation delay time, Data to any output

tPLH4

5

36

ns

tPHL4

5

54

ns

MIL-PRF-38535

Test requirement

Subgroups

(see table III)

Class B Devices

Interim electrical parameters

1

Final electrical test parameters

1*, 2, 3, 7, 9

Group A test requirements

1, 2, 3, 7, 9,

Groups C end point electrical parameters

1, 2, 3

Group D end point electrical  parameters

1, 2, 3

Additional electrical subgroups for

Group C periodic inspections

10, 11