MIL-M-38510/106B
Parameter |
Supplies 1/ 2/ |
Switch positions 1/ |
Measure |
Measured parameter |
Units |
||||||
+VCC |
-VCC |
VIN |
S1 |
S2 |
S3 |
S4 |
Value |
Units |
Equation |
||
VIO(1) 3/ |
+18 V |
-18 V |
--- |
1 |
1 |
1 |
1 |
E1 |
mV |
VIO = E1 / 100 |
mV |
VIO(2) |
+5 V |
-5 V |
--- |
1 |
1 |
1 |
1 |
E2 |
mV |
VIO = E2 / 100 |
mV |
VIO(ADJ)+ |
+18 V |
-18 V |
--- |
1 |
1 |
2 |
1 |
E3 |
mV |
VIO(ADJ)+ = (E1-E3) / 100 |
mV |
VIO(ADJ)- |
+18 V |
-18 V |
--- |
1 |
1 |
3 |
1 |
E4 |
mV |
VIO(ADJ)- = (E1-E4) / 100 |
mV |
IIB(+) |
+18 V |
-18 V |
--- |
2 |
1 |
1 |
1 |
E5 |
mV |
IIB = (E1-E5) / 100 |
|
RO |
+18 V |
-18 V |
--- |
1 |
1 |
1 |
5 |
E6 |
mV |
RO = (E6-E1) / 200 |
|
+PSR 3/ |
+10 V |
-18 V |
--- |
1 |
1 |
1 |
1 |
E7 |
mV |
+PSR = 20 log10 (E1-E2) / 8x105 |
dB |
-PSR 3/ |
+18 V |
-10 V |
--- |
1 |
1 |
1 |
1 |
E8 |
mV |
-PSR = 20 log10 (E1-E8) / 8x105 |
dB |
+ICC |
+18 V |
-18 V |
--- |
1 |
1 |
1 |
3 |
ICC |
mA |
+ICC = ICC |
mA |
+VOPP1 |
+18 V |
-18 V |
4/ |
1 |
1 |
1 |
1 |
(VO)1 |
V |
VOPP1 = (VO)1 - (VO)2 |
V |
-VOPP1 |
+18 V |
-18 V |
4/ |
1 |
1 |
1 |
1 |
(VO)2 |
V |
||
+VOPP2 |
+18 V |
-18 V |
4/ |
1 |
2 |
1 |
2 |
(VO)3 |
V |
VOPP2 = (VO)3 - (VO)4 |
V |
-VOPP2 |
+18 V |
-18 V |
4/ |
1 |
2 |
1 |
2 |
(VO)4 |
V |
||
IOS(+) |
+18 V |
-18 V |
+15 V |
1 |
1 |
1 |
4 |
IOS1 |
mA |
IOS(+) = IOS1 5 sec test duration |
mA |
IOS(-) |
+18 V |
-18 V |
-15 V |
1 |
1 |
1 |
4 |
IOS2 |
mA |
IOS(-) = IOS2 5 sec test duration |
mA |
1/ Precautions shall be taken to prevent damage to the device under test (DUT) during insertion into socket and change of switch positions (for example. disable voltage supplies, current limit ±VCC, etc.).
2/ All supply voltages must be held to within 0.1 V of the specified value.
3/ E1, E7, and E8 shall be measured to four place accuracy to provide required resolution on PSR.
4/ VIN shall be increased to steps of 0.10 volt, starting at ±9.00 volts as applicable, until the increase in the output is less than 0.08 volt per 0.10 volt increase in the input. The last value of VO shall be used to calculate VOPP.
FIGURE 3. Test circuit for static and dynamic tests - Continued.
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