MIL-M-38510/76C
TABLE I. Electrical performance characteristics.
Test  | 
Symbol  | 
Conditions -55°C ≤ TC ≤ +125°C unless otherwise specified  | 
Device type  | 
Limits  | 
Units  | 
|
Min  | 
Max  | 
|||||
High level output voltage  | 
VOH  | 
VCC = 4.5 V, VIH = 2.0 V, VIL = 0.8 V, IOH = -1 mA  | 
01, 02  | 
2.5  | 
V  | 
|
TC = +125°C, VIL = 0.7 V  | 
02  | 
|||||
Low level output voltage  | 
VOL  | 
VCC = 4.5 V, VIH = 2.0 V, VIL = 0.8 V, IOL = 20 mA  | 
01, 02  | 
0.5  | 
V  | 
|
TC = +125°C, VIL = 0.7 V  | 
01, 02  | 
0.45  | 
||||
Input clamp voltage  | 
VIC  | 
VCC = 4.5 V, IIN = -18 mA, TC = 25°C  | 
01, 02  | 
-1.2  | 
V  | 
|
High level input current, all inputs  | 
IIH1  | 
VCC = 5.5 V, VIN = 2.7 V  | 
01, 02  | 
50  | 
µA  | 
|
High level input current, all inputs  | 
IIH2  | 
VCC = 5.5 V, VIN = 5.5 V  | 
01, 02  | 
1  | 
mA  | 
|
Low level input current, all inputs  | 
IIL  | 
VCC = 5.5 V, VIN = 0.5 V  | 
01, 02  | 
-0.5  | 
-2  | 
mA  | 
Short-circuit output current  | 
IOS  | 
VCC = 5.5 V 1/  | 
01, 02  | 
-40  | 
-100  | 
mA  | 
Supply current  | 
ICC  | 
VCC = 5.5 V 2/  | 
01, 02  | 
130  | 
mA  | 
|
Collector cut-off current  | 
ICEX  | 
VCC = 5.5 V, VIH = 5.5 V, VOH = 5.5 V  | 
01, 02  | 
250  | 
µA  | 
|
Maximum clock frequency  | 
fMAX  | 
VCC = 5.0 V, CL = 50 pF, RL = 2800 (See figure 4)  | 
01  | 
70  | 
MHz  | 
|
Propagation delay time, high-to-low level output from clear  | 
tPHL1  | 
4  | 
28  | 
ns  | 
||
Propagation delay time, low-to-high level output from clock  | 
tPLH2  | 
4  | 
19  | 
ns  | 
||
Propagation delay time, high-to-low level output from clock  | 
tPHL2  | 
4  | 
25  | 
ns  | 
||
Maximum clock frequency  | 
fMAX  | 
VCC = 5.0 V, CL = 50 pF, RL = 2800 (See figure 5)  | 
02  | 
70  | 
MHz  | 
|
Propagation delay time, high-to-low level output from clear  | 
tPHL1  | 
4  | 
28  | 
ns  | 
||
Propagation delay time, low-to-high level output from clock  | 
tPLH2  | 
4  | 
19  | 
ns  | 
||
Propagation delay time, high-to-low level output from clock  | 
tPHL2  | 
4  | 
25  | 
ns  | 
||
1/ Not more than one output should be shorted at a time.
2/ Device type:
01 - With all outputs open, inputs A thru D grounded, 5.5 V applied to S0, S1, clear, and the serial inputs, ICC is tested by applying clock pulse.
02 - With the outputs open, clear at 4.5 V, shift load, J, K , and data inputs grounded, ICC is measured by applying clock pulse.
5
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