MIL-M-38510-62 Microcircuits, Digital, Ecl, And/Nand Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, ECL, logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510162B

TABLE I. Electrical performance characteristics - Continued. (Limits are valid provided circuit is in a test socket and transverse air flow of 500 linear ft1min is maintained.)

Test	Symbol	Conditions 11 -55°C ≤ TC ≤ 125°C	Device type	Limits		Units
				Min	Max
Low-level input current	IIL	VEE = -5.2 V, VCC = 0 V VIL1 = -1.850 V at +25°C, -1.820 V at +125°C, -1.920 V at -55°C.	All	0.3	---	µA
Transition time, low-to-high level	tTLH	VEEL = -3.2 V, VCC = +2.0 V RL = 50 0, CL ≤ 5 pF (output under test) 2 Load = 100 0 to GND (outputs not under test)	01	1.0	4.1	ns
			02	1.0	5.3
Transition time, high-to-low level	tTHL	VEEL = -3.2 V, VCC = +2.0 V RL = 50 0, CL ≤ 5 pF (output under test) 2 Load = 100 0 to GND (outputs not under test)	01	1.0	4.1	ns
			02	1.0	5.3
Propagation delay time, low-to-high level	tPLH	VEEL = -3.2 V, VCC = +2.0 V RL = 50 0, CL ≤ 5 pF (output under test) 2 Load = 100 0 to GND (outputs not under test)	All	1.0	4.7	ns
			02 31	1.0	5.9
Propagation delay time, high-to-low level	tPHL	VEEL = -3.2 V, VCC = +2.0 V RL 2 = 50 0, CL ≤ 5 pF (output under test) Load = 100 0 to GND (outputs not under test)	All	1.0	4.7	ns
			02 31	1.0	5.9

11 Complete terminal conditions shall be as specified in table III.

21 Applicable to "B" inputs only.

31 Applicable to "Common" input only.